Front Matter: Volume 8788
Proc. SPIE 8788, Front Matter: Volume 8788, 878801 (13 May 2013);
Interferometric Techniques
Proc. SPIE 8788, Low coherence full field interference microscopy or optical coherence tomography: recent advances, limitations and future trends, 878802 (13 May 2013);
Proc. SPIE 8788, Excess fraction measurement of a transparent glass thickness in wavelength tuning interferometry, 878803 (13 May 2013);
Proc. SPIE 8788, Metrology for adhesive layer of temporary bonding wafers using IR interferometry, 878804 (13 May 2013);
Proc. SPIE 8788, Concept, realization and performance of a two-beam phase-shifting point diffraction interferometer, 878805 (13 May 2013);
Digital Holography and Holographic Microscopy
Proc. SPIE 8788, Sparsity-based denoising method of wrapped-phase reconstructions in digital holography, 878806 (13 May 2013);
Proc. SPIE 8788, Holographic Interferometry based on photorefractive crystal to measure 3D thermo-elastic distortion of composite structures and comparison with finite element models, 878807 (13 May 2013);
Proc. SPIE 8788, Lensless single-exposure super-resolved interferometric microscopy, 878808 (13 May 2013);
Proc. SPIE 8788, Resolution enhancement and autofocusing in digital holographic microscopy by using structured illumination, 878809 (13 May 2013);
Proc. SPIE 8788, Hybrid and transflective system based on digital holographic microscope and low coherent interferometer for high gradient shape measurement, 87880A (13 May 2013);
Proc. SPIE 8788, Total compensation of chromatic errors in digital color holography using a single recording, 87880B (13 May 2013);
Proc. SPIE 8788, Lensless object scanning holography for diffuse objects, 87880D (13 May 2013);
Measurement of Optical Components and Systems
Proc. SPIE 8788, A long trace profiler with large dynamical range, 87880E (13 May 2013);
Proc. SPIE 8788, Optical characterization method for very small microlenses (sub-50 micron) for industrial mass-production applications, 87880G (13 May 2013);
Digital Holography, Shearography, and Speckle Techniques
Proc. SPIE 8788, Shape reconstruction using dual wavelength digital holography and speckle movements, 87880I (13 May 2013);
Proc. SPIE 8788, Digital holographic inspection for the straight pipe inner surface using multiwavelength from laser diodes, 87880J (13 May 2013);
Proc. SPIE 8788, Seeing through smoke and flames: a challenge for imaging capabilities, met thanks to digital holography at far infrared, 87880K (13 May 2013);
Proc. SPIE 8788, A computational tool to highlight anomalies on shearographic images in optical flaw detection, 87880L (13 May 2013);
Proc. SPIE 8788, ESPI based on spatial fringe analysis method using only two sheets of speckle patterns, 87880M (13 May 2013);
Polarization-based Techniques
Proc. SPIE 8788, Relation between vectorial source structure and coherence-polarization of light, 87880O (13 May 2013);
Proc. SPIE 8788, A polarization-based frequency shifting interferometry for inspecting transparent objects in microelectronics manufacturing, 87880P (13 May 2013);
High-Speed Techniques
Proc. SPIE 8788, Fast and accurate line scanner based on white light interferometry, 87880Q (13 May 2013);
Proc. SPIE 8788, High speed measurement of specular surfaces based on carrier fringe patterns in a line scan Michelson interferometer setup, 87880R (13 May 2013);
Proc. SPIE 8788, Speed-up chromatic sensors by optimized optical filters, 87880S (13 May 2013);
Confocal Sensors
Proc. SPIE 8788, Robust evaluation of intensity curves measured by confocal microscopies, 87880T (13 May 2013);
Proc. SPIE 8788, Model-based assistance system for confocal measurements of rough surfaces, 87880U (13 May 2013);
Proc. SPIE 8788, Parallelized chromatic confocal sensor systems, 87880V (13 May 2013);
Proc. SPIE 8788, Robust signal evaluation for Chromatic Confocal Spectral Interferometry, 87880W (13 May 2013);
Multisensor Approaches
Proc. SPIE 8788, Measurement, visualization and analysis of extremely large data sets with a nanopositioning and nanomeasuring machine, 87880X (13 May 2013);
Proc. SPIE 8788, Model-based, active inspection of three-dimensional objects using a multi-sensor measurement system, 87880Y (13 May 2013);
Fiber-Optics Sensors
Proc. SPIE 8788, High-frequency optical fiber microphone for condition-based maintenance application, 87880Z (13 May 2013);
Proc. SPIE 8788, A space-borne fiber-optic interrogator module based on narrow-band tunable laser diode for temperature monitoring in telecommunication satellites, 878810 (13 May 2013);
Proc. SPIE 8788, Miniature low-cost extrinsic Fabry-Perot interferometer for low-pressure detection, 878811 (13 May 2013);
Proc. SPIE 8788, Applications of tilted fiber Bragg grating in liquid parameters measurement, 878812 (13 May 2013);
Fringe Projection
Proc. SPIE 8788, Experimental comparison of phase-shifting fringe projection and statistical pattern projection for active triangulation systems, 878813 (13 May 2013);
Proc. SPIE 8788, Scanning fringe projection for fast 3D inspection, 878814 (13 May 2013);
Proc. SPIE 8788, High-speed 3D shape measurement using array projection, 878815 (13 May 2013);
Proc. SPIE 8788, Influence of the structured illumination frequency content on the correspondence assignment precision in stereophotogrammetry, 878816 (13 May 2013);
Proc. SPIE 8788, High resolution measurements of filigree, inner geometries with endoscopic micro fringe projection, 878817 (13 May 2013);
Asphere Measurement
Proc. SPIE 8788, Measurement of aspheres and free-form surfaces in a non-null test interferometer: reconstruction of high-frequency errors, 878818 (13 May 2013);
Proc. SPIE 8788, Non-contact profiling for high precision fast asphere topology measurement, 878819 (13 May 2013);
Proc. SPIE 8788, Highly accurate surface maps from profilometer measurements, 87881A (13 May 2013);
Proc. SPIE 8788, Lateral location error compensation algorithm for measuring aspheric surfaces by sub-aperture stitching interferometry, 87881B (13 May 2013);
Proc. SPIE 8788, Deflectometry vs. interferometry, 87881C (13 May 2013);
Proc. SPIE 8788, Approach to the measurement of astronomical mirrors with new procedures, 87881D (13 May 2013);
Proc. SPIE 8788, Precision aspheric optics testing with SCOTS: a deflectometry approach, 87881E (13 May 2013);
Proc. SPIE 8788, Methods to obtain the waveform profile from slope measurements, 87881F (13 May 2013);
Proc. SPIE 8788, Moiré deflectometry under incoherent illumination: 3D profiler for specular surfaces, 87881G (13 May 2013);
Measurements of Large-Scale Objects
Proc. SPIE 8788, Optical profilometer using laser based conical triangulation for inspection of inner geometry of corroded pipes in cylindrical coordinates, 87881H (13 May 2013);
Proc. SPIE 8788, Active retroreflector with in situ beam analysis to measure the rotational orientation in conjunction with a laser tracker, 87881I (13 May 2013);
Proc. SPIE 8788, Automated control of robotic camera tacheometers for measurements of industrial large scale objects, 87881J (13 May 2013);
Proc. SPIE 8788, Development of alignment-guidance device for grooved roll mill using parallel projection imaging technique, 87881K (13 May 2013);
Proc. SPIE 8788, Photogrammetry based system for the measurement of cylindrical forgings axis straightness, 87881L (13 May 2013);
Light Scattering Techniques and Linewidth Measurement
Proc. SPIE 8788, Sub-nanometer in-die overlay metrology: measurement and simulation at the edge of finiteness, 87881N (13 May 2013);