Front Matter: Volume 8788
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878801 (13 May 2013); doi: 10.1117/12.2028782
Interferometric Techniques
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878802 (13 May 2013); doi: 10.1117/12.2025199
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878803 (13 May 2013); doi: 10.1117/12.2020327
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878804 (13 May 2013); doi: 10.1117/12.2020437
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878805 (13 May 2013); doi: 10.1117/12.2020618
Digital Holography and Holographic Microscopy
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878806 (13 May 2013); doi: 10.1117/12.2020554
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878807 (13 May 2013); doi: 10.1117/12.2020542
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878808 (13 May 2013); doi: 10.1117/12.2020580
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878809 (13 May 2013); doi: 10.1117/12.2020298
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880A (13 May 2013); doi: 10.1117/12.2020980
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880B (13 May 2013); doi: 10.1117/12.2022550
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880D (13 May 2013); doi: 10.1117/12.2020564
Measurement of Optical Components and Systems
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880E (13 May 2013); doi: 10.1117/12.2020915
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880G (13 May 2013); doi: 10.1117/12.2020589
Digital Holography, Shearography, and Speckle Techniques
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880I (13 May 2013); doi: 10.1117/12.2020471
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880J (13 May 2013); doi: 10.1117/12.2020371
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880K (13 May 2013); doi: 10.1117/12.2020921
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880L (13 May 2013); doi: 10.1117/12.2020978
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880M (13 May 2013); doi: 10.1117/12.2019204
Polarization-based Techniques
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880O (13 May 2013); doi: 10.1117/12.2020842
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880P (13 May 2013); doi: 10.1117/12.2020736
High-Speed Techniques
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880Q (13 May 2013); doi: 10.1117/12.2020617
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880R (13 May 2013); doi: 10.1117/12.2020121
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880S (13 May 2013); doi: 10.1117/12.2020387
Confocal Sensors
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880T (13 May 2013); doi: 10.1117/12.2020551
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880U (13 May 2013); doi: 10.1117/12.2019991
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880V (13 May 2013); doi: 10.1117/12.2020334
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880W (13 May 2013); doi: 10.1117/12.2020558
Multisensor Approaches
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880X (13 May 2013); doi: 10.1117/12.2020538
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880Y (13 May 2013); doi: 10.1117/12.2020463
Fiber-Optics Sensors
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880Z (13 May 2013); doi: 10.1117/12.2019249
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878810 (13 May 2013); doi: 10.1117/12.2020495
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878811 (13 May 2013); doi: 10.1117/12.2019799
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878812 (13 May 2013); doi: 10.1117/12.2019874
Fringe Projection
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878813 (13 May 2013); doi: 10.1117/12.2020910
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878814 (13 May 2013); doi: 10.1117/12.2020260
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878815 (13 May 2013); doi: 10.1117/12.2020539
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878816 (13 May 2013); doi: 10.1117/12.2020448
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878817 (13 May 2013); doi: 10.1117/12.2020440
Asphere Measurement
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878818 (13 May 2013); doi: 10.1117/12.2021518
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878819 (13 May 2013); doi: 10.1117/12.2020572
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881A (13 May 2013); doi: 10.1117/12.2020302
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881B (13 May 2013); doi: 10.1117/12.2020427
Deflectometry
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881C (13 May 2013); doi: 10.1117/12.2020578
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881D (13 May 2013); doi: 10.1117/12.2020414
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881E (13 May 2013); doi: 10.1117/12.2020721
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881F (13 May 2013); doi: 10.1117/12.2020534
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881G (13 May 2013); doi: 10.1117/12.2014630
Measurements of Large-Scale Objects
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881H (13 May 2013); doi: 10.1117/12.2020966
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881I (13 May 2013); doi: 10.1117/12.2020499
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881J (13 May 2013); doi: 10.1117/12.2019246
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881K (13 May 2013); doi: 10.1117/12.2020332
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881L (13 May 2013); doi: 10.1117/12.2020917
Light Scattering Techniques and Linewidth Measurement
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881N (13 May 2013); doi: 10.1117/12.2020930
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881O (13 May 2013); doi: 10.1117/12.2020880
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881P (13 May 2013); doi: 10.1117/12.2020506
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881Q (13 May 2013); doi: 10.1117/12.2020561
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881R (13 May 2013); doi: 10.1117/12.2020248
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881S (13 May 2013); doi: 10.1117/12.2021888
Laser-Doppler Techniques
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881T (13 May 2013); doi: 10.1117/12.2020168
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881U (13 May 2013); doi: 10.1117/12.2019342
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881V (13 May 2013); doi: 10.1117/12.2020475
Stress, Strain, & Displacement Measurement
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881X (13 May 2013); doi: 10.1117/12.2021580
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881Y (13 May 2013); doi: 10.1117/12.2020758
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881Z (13 May 2013); doi: 10.1117/12.2021039
Poster Session
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878820 (13 May 2013); doi: 10.1117/12.2020341
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878822 (13 May 2013); doi: 10.1117/12.2020411
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878823 (13 May 2013); doi: 10.1117/12.2020407
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878824 (13 May 2013); doi: 10.1117/12.2020404
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878825 (13 May 2013); doi: 10.1117/12.2020385
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878826 (13 May 2013); doi: 10.1117/12.2020384
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878827 (13 May 2013); doi: 10.1117/12.2020370
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878828 (13 May 2013); doi: 10.1117/12.2020369
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878829 (13 May 2013); doi: 10.1117/12.2018919
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882C (13 May 2013); doi: 10.1117/12.2020343
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882D (13 May 2013); doi: 10.1117/12.2020288
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882E (13 May 2013); doi: 10.1117/12.2020285
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882F (13 May 2013); doi: 10.1117/12.2020253
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882G (13 May 2013); doi: 10.1117/12.2020250
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882H (13 May 2013); doi: 10.1117/12.2020244
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882J (13 May 2013); doi: 10.1117/12.2016545
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882K (13 May 2013); doi: 10.1117/12.2020113
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882L (13 May 2013); doi: 10.1117/12.2020058
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882M (13 May 2013); doi: 10.1117/12.2019996
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882N (13 May 2013); doi: 10.1117/12.2019981
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882O (13 May 2013); doi: 10.1117/12.2019864
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882P (13 May 2013); doi: 10.1117/12.2021864
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882Q (13 May 2013); doi: 10.1117/12.2019743
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882R (13 May 2013); doi: 10.1117/12.2021032
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882S (13 May 2013); doi: 10.1117/12.2021028
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882T (13 May 2013); doi: 10.1117/12.2021022
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882U (13 May 2013); doi: 10.1117/12.2020969
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882V (13 May 2013); doi: 10.1117/12.2020968
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882W (13 May 2013); doi: 10.1117/12.2020961
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882X (13 May 2013); doi: 10.1117/12.2020960
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882Y (13 May 2013); doi: 10.1117/12.2020947
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882Z (13 May 2013); doi: 10.1117/12.2020923
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878831 (13 May 2013); doi: 10.1117/12.2020865
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878832 (13 May 2013); doi: 10.1117/12.2020861
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878833 (13 May 2013); doi: 10.1117/12.2019345
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878834 (13 May 2013); doi: 10.1117/12.2020780
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878835 (13 May 2013); doi: 10.1117/12.2020763
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878836 (13 May 2013); doi: 10.1117/12.2020757
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878837 (13 May 2013); doi: 10.1117/12.2020756
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878839 (13 May 2013); doi: 10.1117/12.2020747
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87883A (13 May 2013); doi: 10.1117/12.2020742
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87883B (13 May 2013); doi: 10.1117/12.2020739
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87883C (13 May 2013); doi: 10.1117/12.2020678
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87883D (13 May 2013); doi: 10.1117/12.2020646
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87883E (13 May 2013); doi: 10.1117/12.2019255
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87883F (13 May 2013); doi: 10.1117/12.2020579
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87883G (13 May 2013); doi: 10.1117/12.2020560
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87883H (13 May 2013); doi: 10.1117/12.2020540
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87883I (13 May 2013); doi: 10.1117/12.2020529
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87883J (13 May 2013); doi: 10.1117/12.2020525
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87883K (13 May 2013); doi: 10.1117/12.2020521
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87883M (13 May 2013); doi: 10.1117/12.2020505
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87883O (13 May 2013); doi: 10.1117/12.2020497
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87883P (13 May 2013); doi: 10.1117/12.2020470
Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 87883Q (13 May 2013); doi: 10.1117/12.2020458
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