Proceedings Volume 8790 is from: Logo
SPIE OPTICAL METROLOGY 2013
13-16 May 2013
Munich, Germany
Front Matter: Volume 8790
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 879001 (18 June 2013); doi: 10.1117/12.2032793
New Methods and Applications for Restoration
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 879002 (30 May 2013); doi: 10.1117/12.2020421
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 879003 (30 May 2013); doi: 10.1117/12.2020563
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 879004 (30 May 2013); doi: 10.1117/12.2020582
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 879005 (30 May 2013); doi: 10.1117/12.2020694
Structure and Material Analyses
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 879008 (30 May 2013); doi: 10.1117/12.2020336
Image and Processing and Other Digital Data Processing Methods for Optics
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 879009 (30 May 2013); doi: 10.1117/12.2020286
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87900A (30 May 2013); doi: 10.1117/12.2021318
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87900B (30 May 2013); doi: 10.1117/12.2020516
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87900C (30 May 2013); doi: 10.1117/12.2022521
Integrated Techniques and Case Studies
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87900F (30 May 2013); doi: 10.1117/12.2020535
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87900G (30 May 2013); doi: 10.1117/12.2019881
Stratigraphic and Depth-Resolved Methods
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87900H (30 May 2013); doi: 10.1117/12.2020596
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87900I (30 May 2013); doi: 10.1117/12.2020701
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87900J (30 May 2013); doi: 10.1117/12.2021700
Topography and Tomography
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87900L (30 May 2013); doi: 10.1117/12.2020221
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87900M (30 May 2013); doi: 10.1117/12.2020765
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87900N (30 May 2013); doi: 10.1117/12.2021607
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87900O (30 May 2013); doi: 10.1117/12.2020738
New Portable Instruments for In-Situ Applications
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87900Q (30 May 2013); doi: 10.1117/12.2020477
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87900S (30 May 2013); doi: 10.1117/12.2022155
Surface Examination and Analysis
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87900U (30 May 2013); doi: 10.1117/12.2020397
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87900V (30 May 2013); doi: 10.1117/12.2021186
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87900W (30 May 2013); doi: 10.1117/12.2020643
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87900X (30 May 2013); doi: 10.1117/12.2020447
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87900Y (30 May 2013); doi: 10.1117/12.2020476
Poster Session
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 879011 (30 May 2013); doi: 10.1117/12.2020333
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 879012 (30 May 2013); doi: 10.1117/12.2020225
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 879013 (30 May 2013); doi: 10.1117/12.2020347
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 879014 (30 May 2013); doi: 10.1117/12.2020418
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 879016 (30 May 2013); doi: 10.1117/12.2020648
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 879017 (30 May 2013); doi: 10.1117/12.2020655
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87901A (30 May 2013); doi: 10.1117/12.2020759
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87901F (30 May 2013); doi: 10.1117/12.2021197
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87901G (30 May 2013); doi: 10.1117/12.2021274
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87901H (30 May 2013); doi: 10.1117/12.2021338
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87901K (30 May 2013); doi: 10.1117/12.2022526
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87901L (30 May 2013); doi: 10.1117/12.2022522
Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87901M (30 May 2013); doi: 10.1117/12.2022162
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