Pattern coding strategies for deflectometric measurement systems

Sebastian Höfer; Masoud Roschani; Stefan Werling

doi:10.1117/12.2022133

24 May 2013 Pattern coding strategies for deflectometric measurement systems

Sebastian Höfer, Masoud Roschani, Stefan Werling

Proceedings Volume 8791, Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection; 87911O (2013) https://doi.org/10.1117/12.2022133
Event: SPIE Optical Metrology 2013, 2013, Munich, Germany

Abstract

In this paper we assess the impact of different error sources on the deflectometric measurement. We provide an overview of previous work in this field and fill the gaps to provide a unified measurement model. The focus is on the parameters of a deflectometric setup with the objective to give practice-oriented guidelines for optimizing the deflectometric data acquisition. We will differentiate between systematic error sources which can be anticipated and compensated for and errors which are intrinsic to the deflectometric measurement method itself. In the later case possible trade-offs between parameters are highlighted to enable the optimization of a setup to a specific application.

Citation Download Citation

Sebastian Höfer, Masoud Roschani, and Stefan Werling "Pattern coding strategies for deflectometric measurement systems", Proc. SPIE 8791, Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection, 87911O (24 May 2013); https://doi.org/10.1117/12.2022133

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