24 May 2013 Pattern coding strategies for deflectometric measurement systems
Author Affiliations +
In this paper we assess the impact of different error sources on the deflectometric measurement. We provide an overview of previous work in this field and fill the gaps to provide a unified measurement model. The focus is on the parameters of a deflectometric setup with the objective to give practice-oriented guidelines for optimizing the deflectometric data acquisition. We will differentiate between systematic error sources which can be anticipated and compensated for and errors which are intrinsic to the deflectometric measurement method itself. In the later case possible trade-offs between parameters are highlighted to enable the optimization of a setup to a specific application.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sebastian Höfer, Sebastian Höfer, Masoud Roschani, Masoud Roschani, Stefan Werling, Stefan Werling, "Pattern coding strategies for deflectometric measurement systems", Proc. SPIE 8791, Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection, 87911O (24 May 2013); doi: 10.1117/12.2022133; https://doi.org/10.1117/12.2022133

Back to Top