Second-harmonic interferometry with high spatial resolution: a robust method towards quantitative phase imaging of transparent dispersive materials

F. Brandi; F. Conti; M. Tiberi; F. Giammanco; A. Diaspro

doi:10.1117/12.2020846

23 May 2013 Second-harmonic interferometry with high spatial resolution: a robust method towards quantitative phase imaging of transparent dispersive materials

F. Brandi, F. Conti, M. Tiberi, F. Giammanco, A. Diaspro

Author Affiliations +

Proceedings Volume 8792, Optical Methods for Inspection, Characterization, and Imaging of Biomaterials; 87921K (2013) https://doi.org/10.1117/12.2020846
Event: SPIE Optical Metrology 2013, 2013, Munich, Germany

Abstract

We present a Nd:YAG CW laser based second-harmonic interferometer with 60 μm spatial resolution. The interferometer is sensitive to the phase shift between fundamental and second harmonic radiation when passing through a dispersive medium. The device performance is tested by measuring the dispersion induced phase shift of laser etched polymeric films resulting in a sensitivity down to 7×10⁻³ Rad for a detector acquisition time of 300 μs. These results demonstrate the feasibility of high spatial resolution second-harmonic interferometry, and an outlook is given for its use as a novel quantitative phase sensitive imaging technique.

Citation Download Citation

F. Brandi, F. Conti, M. Tiberi, F. Giammanco, and A. Diaspro "Second-harmonic interferometry with high spatial resolution: a robust method towards quantitative phase imaging of transparent dispersive materials", Proc. SPIE 8792, Optical Methods for Inspection, Characterization, and Imaging of Biomaterials, 87921K (23 May 2013); https://doi.org/10.1117/12.2020846

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