23 May 2013 Second-harmonic interferometry with high spatial resolution: a robust method towards quantitative phase imaging of transparent dispersive materials
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Abstract
We present a Nd:YAG CW laser based second-harmonic interferometer with 60 μm spatial resolution. The interferometer is sensitive to the phase shift between fundamental and second harmonic radiation when passing through a dispersive medium. The device performance is tested by measuring the dispersion induced phase shift of laser etched polymeric films resulting in a sensitivity down to 7×10−3 Rad for a detector acquisition time of 300 μs. These results demonstrate the feasibility of high spatial resolution second-harmonic interferometry, and an outlook is given for its use as a novel quantitative phase sensitive imaging technique.
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F. Brandi, F. Brandi, F. Conti, F. Conti, M. Tiberi, M. Tiberi, F. Giammanco, F. Giammanco, A. Diaspro, A. Diaspro, } "Second-harmonic interferometry with high spatial resolution: a robust method towards quantitative phase imaging of transparent dispersive materials", Proc. SPIE 8792, Optical Methods for Inspection, Characterization, and Imaging of Biomaterials, 87921K (23 May 2013); doi: 10.1117/12.2020846; https://doi.org/10.1117/12.2020846
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