Realistic electric field modeling of multilayered nanostructures by classic electrodynamics and first principles theory

L. G. Il'chenko; V. V. Il'chenko; A. V. Gavrilenko; V. I Gavrilenko

doi:10.1117/12.2025122

11 September 2013 Realistic electric field modeling of multilayered nanostructures by classic electrodynamics and first principles theory

L. G. Il'chenko, V. V. Il'chenko, A. V. Gavrilenko, V. I Gavrilenko

Author Affiliations +

Proceedings Volume 8806, Metamaterials: Fundamentals and Applications VI; 88062P (2013) https://doi.org/10.1117/12.2025122
Event: SPIE NanoScience + Engineering, 2013, San Diego, California, United States

Abstract

Efficient engineering of metamaterials involves modeling of electric field profiles around these structures. Realistic modeling of the electric field in metamaterials requires accurate knowledge of optical constants of the compo- nents for which traditionally the bulk values are taken. Further progress in the developing of metamaterials is characterized by a reduction of the pattern size, dimensions of single layers in multilayered structures etc. It has been understood that optical functions in low-dimensional and nano-sized materials substantially differ from their bulk values increasingly affecting by quantum processes. In this work we develop a complex method for analytical modeling of electric field profiles in metamaterials including quantum processes in nano-sized multi-layered structures. In particular based on first principles density functional theory we obtained simple analytical functions allowing predictions the optical functions variations with the size reduction of single metamaterial components over a wide spectral region. It is shown that optical functions of nano-sized films substantially (by 50 percent and more) differ from those in bulk. The new calculated optical functions of the components are used for electric field profile modeling of nano-sized multilayered structures by nonlocal Green function technique including effects of spatial dispersion. Silicon, silicon dioxide, and water layers are used as an example. The method effectively incorporates real atomic structure reconstruction on surfaces and inner interfaces thus providing with a more realistic picture for modeling. By comparison with experiment it is demonstrated that our method predicts image potential of the nanostructures in better agreement with experiment than if using traditional classic electrodynamics approach neglecting the quantum effects. The results are discussed in comparison with literature.

Citation Download Citation

L. G. Il'chenko, V. V. Il'chenko, A. V. Gavrilenko, and V. I Gavrilenko "Realistic electric field modeling of multilayered nanostructures by classic electrodynamics and first principles theory", Proc. SPIE 8806, Metamaterials: Fundamentals and Applications VI, 88062P (11 September 2013); https://doi.org/10.1117/12.2025122

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
13 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Dielectrics

Silicon

Semiconductors

Interfaces

Silica

Solids

Oxides

Show All Keywords

Keywords/Phrases

Search In:

Publication Years