PROCEEDINGS VOLUME 8848
SPIE OPTICAL ENGINEERING + APPLICATIONS | 25-29 AUGUST 2013
Advances in X-Ray/EUV Optics and Components VIII
IN THIS VOLUME

8 Sessions, 33 Papers, 0 Presentations
Metrology  (5)
Proceedings Volume 8848 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
25-29 August 2013
San Diego, California, United States
Front Matter: Volume 8848
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 884801 (18 October 2013); doi: 10.1117/12.2048408
Novel Developments
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 884802 (27 September 2013); doi: 10.1117/12.2025389
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 884804 (27 September 2013); doi: 10.1117/12.2023465
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 884805 (27 September 2013); doi: 10.1117/12.2023984
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 884806 (27 September 2013); doi: 10.1117/12.2023921
Focusing Techniques
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 884807 (27 September 2013); doi: 10.1117/12.2024127
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 884808 (27 September 2013); doi: 10.1117/12.2024293
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 884809 (27 September 2013); doi: 10.1117/12.2023616
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480A (8 October 2013); doi: 10.1117/12.2027722
X-Ray Mirrors
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480B (27 September 2013); doi: 10.1117/12.2023024
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480C (27 September 2013); doi: 10.1117/12.2023940
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480D (27 September 2013); doi: 10.1117/12.2024675
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480E (27 September 2013); doi: 10.1117/12.2023598
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480F (27 September 2013); doi: 10.1117/12.2023795
Metrology
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480G (27 September 2013); doi: 10.1117/12.2024500
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480H (27 September 2013); doi: 10.1117/12.2024662
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480I (27 September 2013); doi: 10.1117/12.2024694
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480K (27 September 2013); doi: 10.1117/12.2024510
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480L (27 September 2013); doi: 10.1117/12.2027146
Multilayer Coating
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480N (27 September 2013); doi: 10.1117/12.2023889
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480O (27 September 2013); doi: 10.1117/12.2024199
XFEL and Miscellaneous Applications
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480Q (27 September 2013); doi: 10.1117/12.2024489
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480S (27 September 2013); doi: 10.1117/12.2022735
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480T (27 September 2013); doi: 10.1117/12.2025377
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480U (27 September 2013); doi: 10.1117/12.2025142
Poster Session
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480W (27 September 2013); doi: 10.1117/12.2022615
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480Y (27 September 2013); doi: 10.1117/12.2023605
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480Z (27 September 2013); doi: 10.1117/12.2024439
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 884810 (27 September 2013); doi: 10.1117/12.2024528
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 884811 (27 September 2013); doi: 10.1117/12.2024531
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 884812 (27 September 2013); doi: 10.1117/12.2024652
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 884813 (27 September 2013); doi: 10.1117/12.2025369
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 884814 (27 September 2013); doi: 10.1117/12.2026546
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