27 September 2013 Damage threshold investigation using grazing incidence irradiation by hard x-ray free electron laser
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Abstract
X-ray free electron lasers (XFELs) with intense and ultra-short pulse X-rays possibly induce damage to optical elements. We investigated the damage thresholds of optical materials by using focusing XFEL beams with sufficient power density for studying ablation phenomena. 1-μm focusing beams with 10 keV photon energy were produced at the XFEL facility SACLA (SPring-8 Angstrom Compact free electron LAser). The focusing beams irradiated samples of rhodium-coated substrate, which is used in X-ray mirror optics, under grazing incident condition.
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T. Koyama, T. Koyama, H. Yumoto, H. Yumoto, K. Tono, K. Tono, T. Sato, T. Sato, T. Togashi, T. Togashi, Y. Inubushi, Y. Inubushi, T. Katayama, T. Katayama, J. Kim, J. Kim, S. Matsuyama, S. Matsuyama, H. Mimura, H. Mimura, M. Yabashi, M. Yabashi, K. Yamauchi, K. Yamauchi, H. Ohashi, H. Ohashi, } "Damage threshold investigation using grazing incidence irradiation by hard x-ray free electron laser", Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480T (27 September 2013); doi: 10.1117/12.2025377; https://doi.org/10.1117/12.2025377
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