26 September 2013 Investigation and suppression of artifacts in x-ray framing cameras due to advance radiation incident on microchannel plates
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We present evidence of an artifact in gated x-ray framing cameras that can severely impact image quality. This artifact presents as a spatially-varying, high-intensity background and is correlated with experiments that produce a high flux of x-rays during the time before the framing camera is triggered. Dedicated experiments using a short pulse UV laser that arrives before, during, and after the triggering of the framing camera confirm that these artifacts can be produced by light that arrives in advance of the voltage pulse that triggers the camera. This is consistent with these artifacts being the result of photoelectrons produced uniformly at the active area of the camera by early incident light and then selectively trapped by the electromagnetic (EM) fields of the camera. Simulations confirm that the EM field above the active surface can act to confine electrons produced before the camera is triggered. We further present a method to suppress these artifacts by installing a conducting electrode in front of the active area of the framing camera. This device suppresses artifacts by attracting any electrons liberated by x-rays that arrive before the camera is triggered.
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L. R. Benedetti, L. R. Benedetti, J. P. Holder, J. P. Holder, M. P. Perkins, M. P. Perkins, C. S. Anderson, C. S. Anderson, P. M. Bell, P. M. Bell, D. K. Bradley, D. K. Bradley, C. G. Brown, C. G. Brown, S. M. Glenn, S. M. Glenn, D. Hargrove, D. Hargrove, J. Kimbrough, J. Kimbrough, R. B. Petre, R. B. Petre, K. W. Piston, K. W. Piston, N. Simanovskaia, N. Simanovskaia, "Investigation and suppression of artifacts in x-ray framing cameras due to advance radiation incident on microchannel plates", Proc. SPIE 8850, Target Diagnostics Physics and Engineering for Inertial Confinement Fusion II, 88500J (26 September 2013); doi: 10.1117/12.2027149; https://doi.org/10.1117/12.2027149


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