PROCEEDINGS VOLUME 8851
SPIE OPTICAL ENGINEERING + APPLICATIONS | 25-29 AUGUST 2013
X-Ray Nanoimaging: Instruments and Methods
Editor(s): Barry Lai
Proceedings Volume 8851 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
25-29 August 2013
San Diego, California, United States
Front Matter: Volume 8851
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 885101 (11 October 2013); doi: 10.1117/12.2045770
Scanning Probes I
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 885102 (26 September 2013); doi: 10.1117/12.2025169
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 885104 (26 September 2013); doi: 10.1117/12.2027086
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 885106 (26 September 2013); doi: 10.1117/12.2026418
Full-Field Microscopes
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 885107 (26 September 2013); doi: 10.1117/12.2023152
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 885109 (26 September 2013); doi: 10.1117/12.2025792
In-situ TXM Studies
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88510A (5 October 2013); doi: 10.1117/12.2026436
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88510B (26 September 2013); doi: 10.1117/12.2027263
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88510C (26 September 2013); doi: 10.1117/12.2027095
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88510D (26 September 2013); doi: 10.1117/12.2025842
Nanofocusing Optics
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88510G (26 September 2013); doi: 10.1117/12.2026026
Scanning Probes II
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88510K (26 September 2013); doi: 10.1117/12.2027303
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88510L (26 September 2013); doi: 10.1117/12.2026609
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88510M (26 September 2013); doi: 10.1117/12.2025900
Fast Instrumentation
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88510P (26 September 2013); doi: 10.1117/12.2026680
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88510Q (26 September 2013); doi: 10.1117/12.2027195
Novel Nanoimaging Methods
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88510T (26 September 2013); doi: 10.1117/12.2027269
Lab-based Instruments
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88510W (26 September 2013); doi: 10.1117/12.2027193
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88510Y (26 September 2013); doi: 10.1117/12.2026300
Poster Session
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88510Z (26 September 2013); doi: 10.1117/12.2022640
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 885112 (26 September 2013); doi: 10.1117/12.2026149
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 885113 (26 September 2013); doi: 10.1117/12.2026153
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 885117 (26 September 2013); doi: 10.1117/12.2027211
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 885119 (26 September 2013); doi: 10.1117/12.2027251
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88511D (26 September 2013); doi: 10.1117/12.2035589
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