26 September 2013 Simultaneous fast scanning XRF, dark field, phase-, and absorption contrast tomography
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Abstract
Scanning hard X-ray nanoprobe imaging provides a unique tool for probing specimens with high sensitivity and large penetration depth. Moreover, the combination of complementary techniques such as X-ray fluorescence, absorption, phase contrast and dark field imaging gives complete quantitative information on the sample structure, composition and chemistry. The multi-technique “FLYSCAN” data acquisition scheme developed at Synchrotron SOLEIL permits to perform fast continuous scanning imaging and as such makes scanning tomography techniques feasible in a time-frame well-adapted to typical user experiments. Here we present the recent results of simultaneous fast scanning multi-technique tomography performed at Soleil. This fast scanning scheme will be implemented at the Nanoscopium beamline for large field of view 2D and 3D multimodal imaging.
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Kadda Medjoubi, Alain Bonissent, Nicolas Leclercq, Florent Langlois, Pascal Mercère, Andrea Somogyi, "Simultaneous fast scanning XRF, dark field, phase-, and absorption contrast tomography", Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88510P (26 September 2013); doi: 10.1117/12.2026680; https://doi.org/10.1117/12.2026680
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