26 September 2013 Simultaneous fast scanning XRF, dark field, phase-, and absorption contrast tomography
Author Affiliations +
Scanning hard X-ray nanoprobe imaging provides a unique tool for probing specimens with high sensitivity and large penetration depth. Moreover, the combination of complementary techniques such as X-ray fluorescence, absorption, phase contrast and dark field imaging gives complete quantitative information on the sample structure, composition and chemistry. The multi-technique “FLYSCAN” data acquisition scheme developed at Synchrotron SOLEIL permits to perform fast continuous scanning imaging and as such makes scanning tomography techniques feasible in a time-frame well-adapted to typical user experiments. Here we present the recent results of simultaneous fast scanning multi-technique tomography performed at Soleil. This fast scanning scheme will be implemented at the Nanoscopium beamline for large field of view 2D and 3D multimodal imaging.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kadda Medjoubi, Kadda Medjoubi, Alain Bonissent, Alain Bonissent, Nicolas Leclercq, Nicolas Leclercq, Florent Langlois, Florent Langlois, Pascal Mercère, Pascal Mercère, Andrea Somogyi, Andrea Somogyi, "Simultaneous fast scanning XRF, dark field, phase-, and absorption contrast tomography", Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88510P (26 September 2013); doi: 10.1117/12.2026680; https://doi.org/10.1117/12.2026680


Compressed sensing for phase-contrast computed tomography
Proceedings of SPIE (March 07 2012)
X-ray tomographic microscopy at TOMCAT
Proceedings of SPIE (September 17 2008)
Compressive phase contrast tomography
Proceedings of SPIE (September 02 2010)
High-resolution x-ray tomography using laboratory sources
Proceedings of SPIE (September 06 2006)

Back to Top