Optimized cavity-enhanced x-ray sources for x-ray microscopy

J. M. J. Madey; E. B. Szarmes; M. R. Hadmack; B. T. Jacobson; J. M. D. Kowalczyk; P. Niknejadi

doi:10.1117/12.2027193

26 September 2013 Optimized cavity-enhanced x-ray sources for x-ray microscopy

J. M. J. Madey, E. B. Szarmes, M. R. Hadmack, B. T. Jacobson, J. M. D. Kowalczyk, P. Niknejadi

Proceedings Volume 8851, X-Ray Nanoimaging: Instruments and Methods; 88510W (2013) https://doi.org/10.1117/12.2027193
Event: SPIE Optical Engineering + Applications, 2013, San Diego, California, United States

Abstract

It is now widely recognized that the intensity and brightness of inverse-Compton x-ray light sources can be enhanced through the use of a high finesse optical storage cavity. But the criteria for the practical use and optimization of such cavities are less well understood. We will review those criteria and their application to the development of an optimized high brightness 5 - 20 keV inverse-Compton x-ray source under development at the University of Hawai`i.

Citation Download Citation

J. M. J. Madey, E. B. Szarmes, M. R. Hadmack, B. T. Jacobson, J. M. D. Kowalczyk, and P. Niknejadi "Optimized cavity-enhanced x-ray sources for x-ray microscopy", Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88510W (26 September 2013); https://doi.org/10.1117/12.2027193

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