26 September 2013 Optimized cavity-enhanced x-ray sources for x-ray microscopy
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Abstract
It is now widely recognized that the intensity and brightness of inverse-Compton x-ray light sources can be enhanced through the use of a high finesse optical storage cavity. But the criteria for the practical use and optimization of such cavities are less well understood. We will review those criteria and their application to the development of an optimized high brightness 5 - 20 keV inverse-Compton x-ray source under development at the University of Hawai`i.
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J. M. J. Madey, J. M. J. Madey, E. B. Szarmes, E. B. Szarmes, M. R. Hadmack, M. R. Hadmack, B. T. Jacobson, B. T. Jacobson, J. M. D. Kowalczyk, J. M. D. Kowalczyk, P. Niknejadi, P. Niknejadi, } "Optimized cavity-enhanced x-ray sources for x-ray microscopy", Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88510W (26 September 2013); doi: 10.1117/12.2027193; https://doi.org/10.1117/12.2027193
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