26 September 2013 A soft x-ray beamline for quantitative nanotomography using ptychography
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Soft X-ray nanotomography using ptychography allows quantitative imaging of the internal structure of biological and materials samples with high sensitivity. In this work, we describe progress toward the implementation of an interferometer-controlled microscope located at a beamline that provides coherent ux over the photon energy range of 200 to 2000 eV. Recent experimental results are presented to illustrate the potential for two- and three-dimensional imaging at the nanoscale.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Grant A. van Riessen, Mark Junker, Nicholas W. Phillips, Andrew G. Peele, "A soft x-ray beamline for quantitative nanotomography using ptychography", Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 885117 (26 September 2013); doi: 10.1117/12.2027211; https://doi.org/10.1117/12.2027211


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