26 September 2013 A soft x-ray beamline for quantitative nanotomography using ptychography
Author Affiliations +
Abstract
Soft X-ray nanotomography using ptychography allows quantitative imaging of the internal structure of biological and materials samples with high sensitivity. In this work, we describe progress toward the implementation of an interferometer-controlled microscope located at a beamline that provides coherent ux over the photon energy range of 200 to 2000 eV. Recent experimental results are presented to illustrate the potential for two- and three-dimensional imaging at the nanoscale.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Grant A. van Riessen, Mark Junker, Nicholas W. Phillips, Andrew G. Peele, "A soft x-ray beamline for quantitative nanotomography using ptychography", Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 885117 (26 September 2013); doi: 10.1117/12.2027211; https://doi.org/10.1117/12.2027211
PROCEEDINGS
8 PAGES


SHARE
RELATED CONTENT

Calibration results for first NIF Kirkpatrick-Baez microscope
Proceedings of SPIE (September 09 2015)
Refractive lens based full field x ray imaging at 45...
Proceedings of SPIE (September 18 2015)
Tomographic scanning microscope for 1 to 4-KeV xrays
Proceedings of SPIE (September 25 1995)
Tomography with high resolution
Proceedings of SPIE (January 07 2002)
Nanotomography using parabolic refractive x-ray lenses
Proceedings of SPIE (October 26 2004)
The x-ray camera of the EXIST/SXI telescope
Proceedings of SPIE (July 29 2010)

Back to Top