26 September 2013 A soft x-ray beamline for quantitative nanotomography using ptychography
Author Affiliations +
Soft X-ray nanotomography using ptychography allows quantitative imaging of the internal structure of biological and materials samples with high sensitivity. In this work, we describe progress toward the implementation of an interferometer-controlled microscope located at a beamline that provides coherent ux over the photon energy range of 200 to 2000 eV. Recent experimental results are presented to illustrate the potential for two- and three-dimensional imaging at the nanoscale.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Grant A. van Riessen, Grant A. van Riessen, Mark Junker, Mark Junker, Nicholas W. Phillips, Nicholas W. Phillips, Andrew G. Peele, Andrew G. Peele, } "A soft x-ray beamline for quantitative nanotomography using ptychography", Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 885117 (26 September 2013); doi: 10.1117/12.2027211; https://doi.org/10.1117/12.2027211


X-ray imaging glass micro-pore optics
Proceedings of SPIE (September 20 2007)
Maxim: micro-arcsecond x-ray imaging mission
Proceedings of SPIE (February 26 2003)
Tomographic scanning microscope for 1 to 4-KeV xrays
Proceedings of SPIE (September 25 1995)
Tomography with high resolution
Proceedings of SPIE (January 07 2002)
The x-ray camera of the EXIST/SXI telescope
Proceedings of SPIE (July 29 2010)

Back to Top