Paper
26 September 2013 Full-field x-ray nano-imaging at SSRF
Biao Deng, Yuqi Ren, Yudan Wang, Guohao Du, Honglan Xie, Tiqiao Xiao
Author Affiliations +
Abstract
Full field X-ray nano-imaging focusing on material science is under developing at SSRF. A dedicated full field X-ray nano-imaging beamline based on bending magnet will be built in the SSRF phase-II project. The beamline aims at the 3D imaging of the nano-scale inner structures. The photon energy range is of 5-14keV. The design goals with the field of view (FOV) of 20μm and a spatial resolution of 20nm are proposed at 8 keV, taking a Fresnel zone plate (FZP) with outermost zone width of 25 nm. Futhermore, an X-ray nano-imaging microscope is under developing at the SSRF BL13W beamline, in which a larger FOV will be emphasized. This microscope is based on a beam shaper and a zone plate using both absorption contrast and Zernike phase contrast, with the optimized energy set to 10keV. The detailed design and the progress of the project will be introduced.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Biao Deng, Yuqi Ren, Yudan Wang, Guohao Du, Honglan Xie, and Tiqiao Xiao "Full-field x-ray nano-imaging at SSRF", Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88511D (26 September 2013); https://doi.org/10.1117/12.2035589
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Cited by 3 scholarly publications.
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KEYWORDS
X-rays

Nanoimaging

Crystals

Microscopes

Spatial resolution

Zone plates

Monochromators

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