Raman analysis of Zn(1-x)Mn(x)Te polycrystalline films

O. V. Klimov; D. I. Kurbatov; A. S. Opanasyuk; V. V. Kosyak; V. Kopach; P. M. Fochuk; A. E. Bolotnikov; R. B. James

doi:10.1117/12.2023280

26 September 2013 Raman analysis of Zn_1-xMn_xTe polycrystalline films

O. V. Klimov, D. I. Kurbatov, A. S. Opanasyuk, V. V. Kosyak, V. Kopach, P. M. Fochuk, A. E. Bolotnikov, R. B. James

Author Affiliations +

Proceedings Volume 8852, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XV; 88521G (2013) https://doi.org/10.1117/12.2023280
Event: SPIE Optical Engineering + Applications, 2013, San Diego, California, United States

Abstract

In this paper, we have investigated some structural properties, Raman spectra of Zn_1-xMn_xT_e films deposited by the closed space vacuum sublimation under different growth conditions. The obtained results of the Raman spectroscopy and XRD analysis show single phase composition of the samples. The presence of phonon replicas in the Raman spectra of the films indicates their high structural quality. The manganese content (about 7 %) in the layers was determined according to shifting the relative peaks positions.

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O. V. Klimov, D. I. Kurbatov, A. S. Opanasyuk, V. V. Kosyak, V. Kopach, P. M. Fochuk, A. E. Bolotnikov, and R. B. James "Raman analysis of Zn_1-xMn_xTe polycrystalline films", Proc. SPIE 8852, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XV, 88521G (26 September 2013); https://doi.org/10.1117/12.2023280

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