Flat field errors and intra-pixel sensitivities for non-redundant aperture masking interferometry on JWST NIRISS

Alexandra Z. Greenbaum; Anand Sivaramakrishnan; Laurent Pueyo

doi:10.1117/12.2023719

26 September 2013 Flat field errors and intra-pixel sensitivities for non-redundant aperture masking interferometry on JWST NIRISS

Alexandra Z. Greenbaum, Anand Sivaramakrishnan, Laurent Pueyo

Author Affiliations +

Proceedings Volume 8864, Techniques and Instrumentation for Detection of Exoplanets VI; 88641L (2013) https://doi.org/10.1117/12.2023719
Event: SPIE Optical Engineering + Applications, 2013, San Diego, California, United States

Abstract

The James Webb Space Telescope (JWST) is equipped with a 7-hole non-redundant mask on the Near IR Imager and Slitless Spectrograph (NIRISS). Flat field error is likely to limit the contrast of this imaging mode. This can be mitigated by placing calibrator and target on the same pixel. Image plane modeling, using measured intra-pixel sensitivities, enables us to determine the target and calibrator placements to a fraction of a pixel. This is helpful given the barely Nyquist pixel scale on NIRISS and non-uniform sensitivity within the pixel. We discuss the effects of coarse sampling and varied intra-pixel response across the detector on the contrast of JWST AMI. We additionally explore the combination of the sub-Nyquist sampled F277W filter with the mask. Using the F277W filter with NRM will expand the planet formation science possible for JWST.

Citation Download Citation

Alexandra Z. Greenbaum, Anand Sivaramakrishnan, and Laurent Pueyo "Flat field errors and intra-pixel sensitivities for non-redundant aperture masking interferometry on JWST NIRISS", Proc. SPIE 8864, Techniques and Instrumentation for Detection of Exoplanets VI, 88641L (26 September 2013); https://doi.org/10.1117/12.2023719

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