Paper
19 September 2013 Optimisation of performance for platinum nanowires as sub-wavelength bolometers
Pauline Renoux, Dorine Charpentier, Sylvain Augé, Snorri Ingvarsson
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Abstract
Electronic properties and sensitivity of metallic bolometers were studied as a function of thin-film thickness in the active area. Our devices are made of platinum and chromium, with an active area of lateral dimensions 1 μm by 300 nm. The thickness of the metallic film was varied between 3.3 nm and 82.3 nm. Temperature coefficient of resistance and resisitvity were characterized, and are respectively increasing and decreasing with the thickness increasing. A threshold thickness of 40 nm is revealed where both parameters reach a constant value. Responsivity and detectivity were evaluated, unveiling the importance of 1/f noise. Responsivity reaches a maximum value of 2×105 V.W-1 for bolometers with a 7.5 nm thickness. Detectivity keeps a constant value of 1×108 cmHz1/2/W for samples thicker than 40 nm, before dropping considerably as the thickness is decreased. This loss in detectivity is believed to be due to the prominence of 1/f noise in such thin samples.
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Pauline Renoux, Dorine Charpentier, Sylvain Augé, and Snorri Ingvarsson "Optimisation of performance for platinum nanowires as sub-wavelength bolometers", Proc. SPIE 8868, Infrared Sensors, Devices, and Applications III, 88680C (19 September 2013); https://doi.org/10.1117/12.2022287
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KEYWORDS
Bolometers

Platinum

Resistance

Chromium

Thin films

Infrared sensors

Infrared radiation

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