10 June 2013 Nonlinear refractive properties of 1D periodically nanostructured silicon-on-insulator investigated by reflection I-Scan
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Proceedings Volume 8882, ROMOPTO 2012: Tenth Conference on Optics: Micro- to Nanophotonics III; 88820C (2013) https://doi.org/10.1117/12.2032351
Event: ROMOPTO International Conference on Micro- to Nano-Photonics III, 2012, Bucharest, Romania
Abstract
In this work, we study some periodically nanostructured silicon-on-insulator samples that could be considered as a composite material and described by effective medium theory. We present our theoretical and experimental studies on effective linear refractive index and third-order optical nonlinear response of silicon-on-insulator with 1D periodic nanostructures. Using reflection intensity-scan method in continuous wave regime (at 808 nm wavelength) and in femtosecond pulsed laser regime (at 775 nm wavelength and 140 fs pulse duration), we show that the thermal effects and electronic third-order optical nonlinearities are larger than those obtained on bulk silicon and unstructured SOI. Our results may be important for ultrafast silicon photonics.
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Tatiana Bazaru Rujoiu, Tatiana Bazaru Rujoiu, Adrian Petris, Adrian Petris, Valentin I. Vlad, Valentin I. Vlad, } "Nonlinear refractive properties of 1D periodically nanostructured silicon-on-insulator investigated by reflection I-Scan", Proc. SPIE 8882, ROMOPTO 2012: Tenth Conference on Optics: Micro- to Nanophotonics III, 88820C (10 June 2013); doi: 10.1117/12.2032351; https://doi.org/10.1117/12.2032351
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