10 June 2013 Polarization-singular structure of phase-inhomogeneous layers for diagnostics and classification of their optical properties
Author Affiliations +
Proceedings Volume 8882, ROMOPTO 2012: Tenth Conference on Optics: Micro- to Nanophotonics III; 88820P (2013) https://doi.org/10.1117/12.2032655
Event: ROMOPTO International Conference on Micro- to Nano-Photonics III, 2012, Bucharest, Romania
Abstract
This work is aimed at ascertaining the possibilities to diagnose and classify phase-inhomogeneous layers (PhIL) of various types (surface-scattering, subsurface-scattering and bulk-scattering ones) by determination values and ranges for changing the statistical (moments of the 1-st to 4-th orders), correlation (autocorrelation functions) and fractal (logarithmic dependences for power spectra) parameters that characterize coordinate distributions for polarization-singular states in PhIL laser images.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. G. Ushenko, A. G. Ushenko, A. V. Dubolazov, A. V. Dubolazov, } "Polarization-singular structure of phase-inhomogeneous layers for diagnostics and classification of their optical properties", Proc. SPIE 8882, ROMOPTO 2012: Tenth Conference on Optics: Micro- to Nanophotonics III, 88820P (10 June 2013); doi: 10.1117/12.2032655; https://doi.org/10.1117/12.2032655
PROCEEDINGS
15 PAGES


SHARE
Back to Top