14 November 2013 Modeling femtosecond pulse laser damage on conductors using Particle-In-Cell simulations
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Abstract
We present, to our knowledge, the first adaptation of the Particle-In-Cell (PIC) simulation method for use in the study of femtosecond pulse laser damage, including the first implementation of the Morse potential for PIC codes. We compare the PIC method to a wide variety of currently used modeling schemes, ranging from purely ab-initio molecular dynamics simulations to semi-empirical models with many fitting parameters, and show how PIC simulations can provide a complementary approach by filling the gap in theoretical methodology between the two cases. We detail the necessity and implementation of an inter-atomic pair-potential in PIC studies of laser damage. Lastly, we use our model to treat the full laser damage process of a copper target, and show that our results compare well to simple scaling laws for crater size.
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Robert A. Mitchell, Robert A. Mitchell, Douglass Schumacher, Douglass Schumacher, Enam Chowdhury, Enam Chowdhury, } "Modeling femtosecond pulse laser damage on conductors using Particle-In-Cell simulations", Proc. SPIE 8885, Laser-Induced Damage in Optical Materials: 2013, 88851U (14 November 2013); doi: 10.1117/12.2030229; https://doi.org/10.1117/12.2030229
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