25 October 2013 Test stand for non-uniformity correction of microbolometer focal plane arrays used in thermal cameras
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Abstract
Uneven response of particular detectors (pixels) to the same incident power of infrared radiation is an inherent feature of microbolometer focal plane arrays. As a result an image degradation occurs, known as Fixed Pattern Noise (FPN), which distorts the thermal representation of an observed scene and impairs the parameters of a thermal camera. In order to compensate such non-uniformity, several NUC correction methods are applied in digital data processing modules implemented in thermal cameras. Coefficients required to perform the non-uniformity correction procedure (NUC coefficients) are determined by calibrating the camera against uniform radiation sources (blackbodies). Non-uniformity correction is performed in a digital processing unit in order to remove FPN pattern in the registered thermal images. Relevant correction coefficients are calculated on the basis of recorded detector responses to several values of radiant flux emitted from reference IR radiation sources (blackbodies). The measurement of correction coefficients requires specialized setup, in which uniform, extended radiation sources with high temperature stability are one of key elements. Measurement stand for NUC correction developed in Institute of Optoelectronics, MUT, comprises two integrated extended blackbodies with the following specifications: area 200×200 mm, stabilized absolute temperature range +15 °C÷100 °C, and uniformity of temperature distribution across entire surface ±0.014 °C. Test stand, method used for the measurement of NUC coefficients and the results obtained during the measurements conducted on a prototype thermal camera will be presented in the paper.
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Michał Krupiński, Michał Krupiński, Jaroslaw Bareła, Jaroslaw Bareła, Krzysztof Firmanty, Krzysztof Firmanty, Mariusz Kastek, Mariusz Kastek, } "Test stand for non-uniformity correction of microbolometer focal plane arrays used in thermal cameras", Proc. SPIE 8896, Electro-Optical and Infrared Systems: Technology and Applications X, 889611 (25 October 2013); doi: 10.1117/12.2028633; https://doi.org/10.1117/12.2028633
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