17 September 2013 Optical nonlinearity measurements of copper phthalocyanine film
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Proceedings Volume 8904, International Symposium on Photoelectronic Detection and Imaging 2013: High Power Lasers and Applications; 890412 (2013) https://doi.org/10.1117/12.2034318
Event: ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging, 2013, Beijing, China
Abstract
The nonlinear refractive response of a copper phthalocyanine film fabricated by the electro-deposition is investigated by a modified top-hat Z-scan with 19 picoseconds pulse at wavelength of 532 nm. Compared to the top-hat Z-scan, the curve of modified top-hat Z-scan for the nonlinear refraction shows a single peak rather than a peek-valley curve. Furthermore, the sensitivity of this new technique can be more than two orders of magnitude enhanced. The results show that the film has obvious response of nonlinear refraction. The theoretical simulation fit well with experimental results.
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Li-hao Luo, Li-hao Luo, Yu Fang, Yu Fang, Xiang-yong Chu, Xiang-yong Chu, Xing-zhi Wu, Xing-zhi Wu, Junyi Yang, Junyi Yang, Ying-lin Song, Ying-lin Song, "Optical nonlinearity measurements of copper phthalocyanine film", Proc. SPIE 8904, International Symposium on Photoelectronic Detection and Imaging 2013: High Power Lasers and Applications, 890412 (17 September 2013); doi: 10.1117/12.2034318; https://doi.org/10.1117/12.2034318
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