Paper
21 August 2013 Research on the method of fast photoelectric diagnostics based on ordinary CCD
Bingli Zhu, Yonglin Bai, Baiyu Liu, Bo Wang, Xiaohong Bai, Yongsheng Gou, Junjun Qin, Wenzheng Yang
Author Affiliations +
Proceedings Volume 8908, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications; 89080R (2013) https://doi.org/10.1117/12.2032841
Event: ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging, 2013, Beijing, China
Abstract
A novel method to realize fast photoelectric diagnostics using ordinary CCD is presented. By changing the mode of charge transfer of CCD, fast photoelectric diagnostics of single point with linear CCD and high-speed line scanning with array CCD can be achieved respectively. A fast photoelectric diagnostics system of single point based on linear CCD has been designed and fabricated to investigate the feasibility of this method. A pulsed blue light emitting diode (LED) has been used to measure the system. As a proof of concept, the rate of photoelectric diagnostics of single point reachs up to 20 MHz. The results demonstrated that the method of fast photoelectric diagnostics based on ordinary CCD is feasible.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bingli Zhu, Yonglin Bai, Baiyu Liu, Bo Wang, Xiaohong Bai, Yongsheng Gou, Junjun Qin, and Wenzheng Yang "Research on the method of fast photoelectric diagnostics based on ordinary CCD", Proc. SPIE 8908, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications, 89080R (21 August 2013); https://doi.org/10.1117/12.2032841
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KEYWORDS
Charge-coupled devices

Diagnostics

Light emitting diodes

CCD image sensors

Clocks

Field programmable gate arrays

Image sensors

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