10 October 2013 The performance of an inspection system for indium tin oxide circuits by using a PDLC/ITO film
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Proceedings Volume 8916, Sixth International Symposium on Precision Mechanical Measurements; 89161N (2013) https://doi.org/10.1117/12.2035682
Event: Sixth International Symposium on Precision Mechanical Measurements, 2013, Guiyang, China
Abstract
An inspection system for indium tin oxide (ITO) circuits has been developed with the use of a polymer dispersed liquid crystal (PDLC)/ITO film which was used as a sensing device to locate faulty shut/open circuits. With the power on, the PDLC/ITO film covering the conducting area was changed from translucent state to clear state while those covering the non-conducting area was remain translucent. In this study, simulations and experiments were conducted to evaluate the performance of the proposed system and study effects of system parameters on the limitation of the proposed system. It is of interest to find that the increase in applied external voltage will improve the capability of identifying conducting area while that will generally degrade the capability of identifying non-conducting area with the range studied.
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C.-H. Chan, C.-H. Chan, Y.-T. Zou, Y.-T. Zou, C.-T. Chen, C.-T. Chen, T.-K. Liu, T.-K. Liu, C.-H. Chen, C.-H. Chen, H.-W. Wang, H.-W. Wang, S.-C. Lin, S.-C. Lin, "The performance of an inspection system for indium tin oxide circuits by using a PDLC/ITO film", Proc. SPIE 8916, Sixth International Symposium on Precision Mechanical Measurements, 89161N (10 October 2013); doi: 10.1117/12.2035682; https://doi.org/10.1117/12.2035682
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