7 December 2013 The application and quantitative testing of 150 million pixel CMOS image sensor
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Abstract
With the requirements of high time resolution, high spatial and high spectral resolution development in geostationary orbit, photodetector pixel size has gradually become the bottleneck of the space exploration technology. Shanghai Institute of Technical Physics of Chinese Academy of Science has made a new breakthrough in CMOS image sensor area. The scale of its new CMOS image sensor achieves 2.5K×2.5K, and then use 24 detectors to achieve a detector whose scale is 150 million. The detector has been successfully imaging on the ground. In the application process, presents a systematic test and measurement methods to deal with the time noise, dark current, fixed pattern noise, MTF and other parameters of the detector. The test results are below. The MTF of the detector is 0.565 which is measured at 57.21/mm Nyquist frequency. The number of saturated electrons reaches 8.9×104. The total number of transient noise electrons is smaller than 16. The signal to noise ratio is 58.02dB. Through comprehensive analysis and measurement, it shows that the overall performance of the 2.5K×2.5K detector among the same types of products is in the leading position currently.
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Xueyi Gong, Fansheng Cheng, Sijie Huang, Xiaofeng Su, Yucui Dong, "The application and quantitative testing of 150 million pixel CMOS image sensor", Proc. SPIE 8923, Micro/Nano Materials, Devices, and Systems, 89234C (7 December 2013); doi: 10.1117/12.2033523; https://doi.org/10.1117/12.2033523
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