28 February 2014 High frequency pupillometry
Author Affiliations +
Proceedings Volume 8930, Ophthalmic Technologies XXIV; 89300F (2014) https://doi.org/10.1117/12.2042917
Event: SPIE BiOS, 2014, San Francisco, California, United States
We report pupillometry results corresponding to three studies. A first study aims at measuring 2D pupil geometry with high precision (below 2 microns) at high frequency (more than 450Hz). The two other studies aim at measuring 3D pupil movements, with and without a chin rest. Results of measurements over 42 subjects are presented.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Serge Meimon, Jessica Jarosz, Guillaume Chenegros, Cyril Petit, Jean-Marc Conan, Béatrice Sorrente, Michel Paques, "High frequency pupillometry", Proc. SPIE 8930, Ophthalmic Technologies XXIV, 89300F (28 February 2014); doi: 10.1117/12.2042917; https://doi.org/10.1117/12.2042917

Back to Top