20 February 2014 Measurement of thermal lensing in GaAs induced by 100 W Tm:fiber laser
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Abstract
We present the characterization of thermal distortion induced in bulk and orientation-patterned GaAs samples by a 100 W narrow linewidth, linearly polarized CW Tm:fiber laser focused to ~150 μm diameter. For a 500-μm thick bulk GaAs sample, the induced thermal distortion is measured using a probe laser beam at 1080 nm and a Shack-Hartmann wavefront sensor (SHWS). We also compare the power dependent induced divergence for 500-μm thick bulk GaAs and 10-mm thick orientation-partnered GaAs (OP-GaAs) samples as they are translated axially through the focus of a 2-μm wavelength Tm:fiber laser beam.
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Joshua Bradford, Konstantin Vodopyanov, Peter Schunemann, Lawrence Shah, Martin Richardson, "Measurement of thermal lensing in GaAs induced by 100 W Tm:fiber laser", Proc. SPIE 8964, Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications XIII, 896419 (20 February 2014); doi: 10.1117/12.2041323; https://doi.org/10.1117/12.2041323
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