Translator Disclaimer
12 July 1988 Probing Surfaces With The Atomic Force Microscope
Author Affiliations +
Proceedings Volume 0897, Scanning Microscopy Technologies and Applications; (1988)
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States
The Atomic Force Microscope can resolve features on conducting or nonconducting surfaces down to the atomic level. The heights of features are recorded as a sharp tip scans over the surface in parallel scans. The interaction between the tip and the surface is the interaction potential between atoms. Individual carbon atoms separated by 0.146 nm have been resolved on graphite. Ordered structure on the "native" oxide of silicon has been observed. Rows of molecules that are separated by 0.5 nm have been resolved in an organic monolayer. The key to the operation of an AFM is the development of a system for sensing tracking forces that are small enough to avoid damaging the surface. The images in this report were obtained by sensing with electron tunneling the deflection 1 - 10 nm) of springs (k 0.1 - 100 N/m) fabricated from silicon oxide or fine wires.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
O Marti, B Drake, S Gould, and P K Hansma "Probing Surfaces With The Atomic Force Microscope", Proc. SPIE 0897, Scanning Microscopy Technologies and Applications, (12 July 1988);


Field effect sensors for PCR applications
Proceedings of SPIE (March 29 2004)
Silicon single atom steps as AFM height standards
Proceedings of SPIE (August 22 2001)
Scanning probe microscopy for nanotechnology
Proceedings of SPIE (July 29 2002)
Electromechanical stability of capacitive transducers
Proceedings of SPIE (April 05 2001)
Microfabricated EIS biosensor for detection of DNA
Proceedings of SPIE (January 19 2006)

Back to Top