Characterization Of Thin Film Magnetic Recording Heads Using Transverse Kerr Effect

Avtar Singh; Thomas Fugate

doi:10.1117/12.944558

2 June 1988 Characterization Of Thin Film Magnetic Recording Heads Using Transverse Kerr Effect

Avtar Singh, Thomas Fugate

Proceedings Volume 0898, Miniature Optics and Lasers; (1988) https://doi.org/10.1117/12.944558
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States

Abstract

This paper proposes a new cost effective method for the testing of thin film magnetic recording heads. The primary advantage of this technique is that through use of magneto-optics, test can be carried out at the wafer level and thereby eliminate defective heads before additional manufacturing costs are added to the product.

Citation Download Citation

Avtar Singh and Thomas Fugate "Characterization Of Thin Film Magnetic Recording Heads Using Transverse Kerr Effect", Proc. SPIE 0898, Miniature Optics and Lasers, (2 June 1988); https://doi.org/10.1117/12.944558

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