The authors propose an alternative method for high resolution optical microscopy - Evanescent Field Scanning Optical
Microscopy (EFSOM) which eliminates implementation of the scanning tip compare to classical NSOM technique. The
approach involves scanning a sample in the evanescent-field of a prism generated using total internal reflection (TIR)
and recording the reflected power as a function of position. The reflection pattern of the wave is collected and processed,
using comparative differentiation. The extracted information is processed further to eliminate any distortions. The
system is not limited by diffraction and resolution primarily depends on the characteristics of the photo-detector and
scanning velocity. Implementation of thin silver layer and coupling of incident radiation into Surface Plasmons
Polaritons (SPP) improves system sensitivity and reduces photo detector dynamic range requirements.