7 March 2014 Ultrafast THz-pulse-induced tunneling dynamics in an STM
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Abstract
We have recently developed an ultrafast terahertz-pulse-coupled scanning tunneling microscope (THz-STM) that can image nanoscale dynamics with simultaneous 0.5 ps temporal resolution and 2 nm spatial resolution under ambient conditions. Broadband THz pulses that are focused onto the metallic tip of an STM induce sub-picosecond voltage transients across the STM junction, producing a rectified current signal due to the nonlinear tunnel junction currentvoltage (I-V) relationship. We use the Simmons model to simulate a tunnel junction I-V curve whereby a THz pulse induces an ultrafast voltage transient, generating milliamp-level rectified currents over sub-picosecond timescales. The nature of the ultrafast field emission tunneling regime achieved in the THz-STM is discussed.
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Vedran Jelic, Tyler L. Cocker, James R. Hoffman, Manisha Gupta, Reginald Miller, Sean J. Molesky, Jacob A. J. Burgess, Glenda B. De Los Reyes, Lyubov V. Titova, Ying Y. Tsui, Mark R. Freeman, Frank A. Hegmann, "Ultrafast THz-pulse-induced tunneling dynamics in an STM", Proc. SPIE 8984, Ultrafast Phenomena and Nanophotonics XVIII, 898412 (7 March 2014); doi: 10.1117/12.2040413; https://doi.org/10.1117/12.2040413
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