Translator Disclaimer
7 March 2014 Ultrafast THz-pulse-induced tunneling dynamics in an STM
Author Affiliations +
We have recently developed an ultrafast terahertz-pulse-coupled scanning tunneling microscope (THz-STM) that can image nanoscale dynamics with simultaneous 0.5 ps temporal resolution and 2 nm spatial resolution under ambient conditions. Broadband THz pulses that are focused onto the metallic tip of an STM induce sub-picosecond voltage transients across the STM junction, producing a rectified current signal due to the nonlinear tunnel junction currentvoltage (I-V) relationship. We use the Simmons model to simulate a tunnel junction I-V curve whereby a THz pulse induces an ultrafast voltage transient, generating milliamp-level rectified currents over sub-picosecond timescales. The nature of the ultrafast field emission tunneling regime achieved in the THz-STM is discussed.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vedran Jelic, Tyler L. Cocker, James R. Hoffman, Manisha Gupta, Reginald Miller, Sean J. Molesky, Jacob A. J. Burgess, Glenda B. De Los Reyes, Lyubov V. Titova, Ying Y. Tsui, Mark R. Freeman, and Frank A. Hegmann "Ultrafast THz-pulse-induced tunneling dynamics in an STM", Proc. SPIE 8984, Ultrafast Phenomena and Nanophotonics XVIII, 898412 (7 March 2014);

Back to Top