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4 April 2014 Front Matter: Volume 8987
Proceedings Volume 8987, Oxide-based Materials and Devices V; 898701 (2014)
Event: SPIE OPTO, 2014, San Francisco, California, United States
This PDF file contains the front matter associated with SPIE Proceedings Volume 8987 including the Title Page, Copyright information, Table of Contents, Introduction, and Conference Committee listing.

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Proceedings of SPIE 0277-786X, Volume 8987

SPIE is an international society advancing an interdisciplinary approach to the science and application of light.

The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from this book:

Author(s), “Title of Paper,” in Oxide-based Materials and Devices V, edited by Ferechteh H. Teherani, David C. Look, David J. Rogers, Proceedings of SPIE Vol. 8987 (SPIE, Bellingham, WA, 2014) Article CID Number.

ISSN: 0277-786X

ISBN: 9780819499004

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Conference Committee

Symposium Chairs

  • David L. Andrews, University of East Anglia Norwich (United Kingdom)

    Alexei L. Glebov, OptiGrate Corporation (United States)

Symposium Co-chairs

  • Jean Emmanuel Broquin, IMEP-LAHC (France)

    Shibin Jiang, AdValue Photonics, Inc. (United States)

Program Track Chair

  • James G. Grote, Air Force Research Laboratory (United States)

Conference Chairs

  • Ferechteh H. Teherani, Nanovation (France)

  • David C. Look, Wright State University (United States)

  • David J. Rogers, Nanovation (France)

Conference Program Committee

  • Philippe Bove, Nanovation (France)

  • Ivan Bozovic, Brookhaven National Laboratory (United States)

    Won Kook Choi, Korea Institute of Science and Technology (Korea, Republic of)

    Jean-Jacques Delaunay, The University of Tokyo (Japan)

    Aleksandra B. Djurišic, The University of Hong Kong (Hong Kong,China)

  • Michael D. Gerhold, U.S. Army Research Office (United States)

    Hanns-Ulrich Habermeier, Max-Planck-Institut für Festkörperforschung(Germany)

  • Axel Hoffmann, Technische Universität Berlin (Germany)

    Masashi Kawasaki, Tohoku University (Japan)

    Katharina Lorenz, Instituto Superior Técnico (Portugal)

    Andreia Luisa da Rosa, Universität Bremen (Germany)

    Tariq Manzur, Naval Undersea Warfare Center (United States)

    Tatsuo Okada, Kyushu University (Japan)

  • Thierry Pauporté, Ecole Nationale Supérieure de Chimie de Paris (France)

  • Robert Plana, Laboratoiré d’Analyse et d’Architecture des Systèmes (France)

  • Manijeh Razeghi, Northwestern University (United States)

    Vinod Eric Sandana, Graphos (France)

  • Bruno Viana, Ecole Nationale Supérieure de Chimie de Paris (France)

  • Magnus Willander, Linköping Universitet (Sweden)

  • Takafumi Yao, Tohoku University (Japan)

  • Jae Su Yu, Kyung Hee University (Korea, Republic of)

Session Chairs

  • 1 Transparent Conducting Oxides

    Axel Hoffmann, Technische Universität Berlin (Germany)

  • 2 Photon-induced Phenomena

    David C. Look, Wright State University (United States)

  • 3 Doping and Band Structure Studies of Oxides

    Aleksandra B. Djurišic, The University of Hong Kong (Hong Kong, China)

    Guy Garry, Thales Research & Technology (France)

  • 4 Doping and Band Structure Studies of ZnO

    Aleksandra B. Djurišic, The University of Hong Kong (Hong Kong, China)

  • 5 Highly-Correlated Oxides I

    Hideki Yamamoto, NTT Basic Research Laboratories (Japan)

    Hanns-Ulrich Habermeier, Max-Planck-Institut für Festkörperforschung (Germany)

  • 6 Highly-Correlated Oxides II

    Hideki Yamamoto, NTT Basic Research Laboratories (Japan)

    Hanns-Ulrich Habermeier, Max-Planck-Institut für Festkörperforschung (Germany)

  • 7 Thin Films and Bulk Processing David J. Rogers, Nanovation (France)

  • 8 Growth, Properties, and Applications of Nanostructures

    Jose Luis Pau Vizcaíno, Universidad Autónoma de Madrid (Spain)

    Philippe Bove, Nanovation (France)

  • 9 ZnO-based Transistors

    Jose Luis Pau Vizcaíno, Universidad Autónoma de Madrid (Spain)

  • 10 Oxide-based Detectors

    David J. Rogers, Nanovation (France)

    Jong-Ho Lee, Korea Institute of Industrial Technology (Korea, Republic of)

  • 11 Oxide-based Light Emitters

    David J. Rogers, Nanovation (France)

    Thierry Pauporté, Ecole Nationale Supérieure de Chimie de Paris (France)

  • 12 Energy Harvesting Storage: Materials and Devices

    Vinod Eric Sandana, Graphos (France) Magnus Willander, Linköping Universitet (Sweden)

  • 13 Energy Harvesting Storage: Metal Oxides and Graphene

    Bruno Viana, Ecole Nationale Supérieure de Chimie de Paris (France)


This volume contains the proceedings of the fifth annual “Oxide Based Materials and Devices” conference which was held at SPIE Photonics West in San Francisco. The conference had its most successful year to date in 2014, with 75 oral and 20 poster presentations of excellent quality from groups in 23 countries covering an ever-widening range of both materials and applications. The conference also attracted a growing industrial interest, with presentations from 20 companies ranging in size from start-ups to multinationals.

The chairs wish to thank the SPIE team for their exemplary organization plus all those who contributed and made this a very lively and stimulating conference. We would also especially like to recognize the efforts of those who took the time to contribute a paper and create this valuable and searchable record of the meeting.

We are looking forward to seeing you in San Francisco next February for “Oxide Based Materials and Devices VI”!

Ferechteh H. Teherani

David C. Look

David J. Rogers

© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 8987", Proc. SPIE 8987, Oxide-based Materials and Devices V, 898701 (4 April 2014);

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