Precision alignment of integrated optics in surface electrode ion traps for quantum information processing

Amber L. Young; Jeffrey D. Hunker; A. Robert Ellis; Sally Samora; Joel R. Wendt; Daniel L. Stick

doi:10.1117/12.2040795

8 March 2014 Precision alignment of integrated optics in surface electrode ion traps for quantum information processing

Amber L. Young, Jeffrey D. Hunker, A. Robert Ellis, Sally Samora, Joel R. Wendt, Daniel L. Stick

Proceedings Volume 8989, Smart Photonic and Optoelectronic Integrated Circuits XVI; 89890L (2014) https://doi.org/10.1117/12.2040795
Event: SPIE OPTO, 2014, San Francisco, California, United States

Abstract

The integration of optics for efficient light delivery and the collection of fluorescence from trapped ions in surface electrode ion traps is a key component to achieving scalability for quantum information processing. Diffractive optical elements (DOEs) present a promising approach as compared to bulk optics because of their small physical profile and their flexibility in tailoring the optical wavefront. The precise alignment of the optics for coupling fluorescence to and from the ions, however, poses a particular challenge. Excitation and manipulation of the ions requires a high degree of optical access, significantly restricting the area available for mounting components. The ion traps, DOEs, and other components are compact, constraining the manipulation of various elements. For efficient fluorescence collection from the ions the DOE must be have a large numerical aperture (NA), which results in greater sensitivity to misalignment. The ion traps are sensitive devices, a mechanical approach to alignment such as contacting the trap and using precision motors to back-off a set distance not only cannot achieve the desired alignment precision, but risks damage to the ion trap. We have developed a non-contact precision optical alignment technique. We use line foci produced by off-axis linear Fresnel zone plates (FZPs) projected on alignment targets etched in the top metal layer of the ion trap and demonstrate micron-level alignment accuracy.

Citation Download Citation

Amber L. Young, Jeffrey D. Hunker, A. Robert Ellis, Sally Samora, Joel R. Wendt, and Daniel L. Stick "Precision alignment of integrated optics in surface electrode ion traps for quantum information processing", Proc. SPIE 8989, Smart Photonic and Optoelectronic Integrated Circuits XVI, 89890L (8 March 2014); https://doi.org/10.1117/12.2040795

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KEYWORDS

Optical alignment

Ions

Epoxies

Silica

Semiconducting wafers

Zone plates

Integrated optics

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