8 March 2014 The evolution of angled MMI structure on the SOI platform
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Proceedings Volume 8990, Silicon Photonics IX; 89900E (2014) https://doi.org/10.1117/12.2039577
Event: SPIE OPTO, 2014, San Francisco, California, United States
Abstract
The angled multimode interferometer (AMMI) was recently demonstrated as a wavelength division (de)multiplexing (WDM) structure employing the phenomenon of dispersive self-imaging in a multimode planar waveguide. It has distinct advantages including very low insertion loss, ease of fabrication and good tolerance to fabrication error. Here, we first demonstrated a further optimized single 4-channel AMMI on the silicon-on-insulator (SOI) platform with a low insertion loss of < 1 dB, a low cross talk of < -23 dB and a non-uniformity of < 0.5 dB. However, a single AMMI is limited to have small channel count with a relatively large channel spacing in order to maintain high-performance WDM functionality. Therefore we subsequently demonstrated two structures derived from a single AMMI on the SOI platform: An 8-channel WDM comprising of two 4-channel AMMIs interleaved by an imbalanced Mach-Zehnder interferometers (MZIs) was fabricated. Low-insertion-loss and low-cross-talk operation was achieved without active tuning structures.
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Y. Hu, D. J. Thomson, F. Y. Gardes, G. Z. Mashanovich, G. T. Reed, "The evolution of angled MMI structure on the SOI platform", Proc. SPIE 8990, Silicon Photonics IX, 89900E (8 March 2014); doi: 10.1117/12.2039577; https://doi.org/10.1117/12.2039577
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