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6 March 2014 3D mesh indexing based on structural analysis
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Proceedings Volume 9013, Three-Dimensional Image Processing, Measurement (3DIPM), and Applications 2014; 901305 (2014)
Event: IS&T/SPIE Electronic Imaging, 2014, San Francisco, California, United States
This paper presents a novel pattern recognition method based on Reeb graph representation. The main idea of this approach is to reinforce the topological consistency conditions of the graph-based description. This approach enfolds an off-line step and an on-line step. In the off-line one, 3D shape is represented by a Reeb graph associated with geometrical signatures based on parametrization approaches. The similarity estimation is performed in the on-line step. It consists to compute a global similarity measure which quantifies the similitude degree between any pair of 3D-models in the given dataset. The experimental results obtained on the SHREC 2012 database show the system effectiveness in 3D shape recognition.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Hachani, A. Ouled Zaid, and W. Puech "3D mesh indexing based on structural analysis", Proc. SPIE 9013, Three-Dimensional Image Processing, Measurement (3DIPM), and Applications 2014, 901305 (6 March 2014);


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