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3 February 2014 On the analysis of wavelet-based approaches for print mottle artifacts
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Proceedings Volume 9016, Image Quality and System Performance XI; 901609 (2014)
Event: IS&T/SPIE Electronic Imaging, 2014, San Francisco, California, United States
Print mottle is one of several attributes described in ISO/IEC DTS 24790, a draft technical specification for the measurement of image quality for monochrome printed output. It defines mottle as aperiodic fluctuations of lightness less than about 0.4 cycles per millimeter, a definition inherited from the latest official standard on printed image quality, ISO/IEC 13660. In a previous publication, we introduced a modification to the ISO/IEC 13660 mottle measurement algorithm that includes a band-pass, wavelet-based, filtering step to limit the contribution of high-frequency fluctuations including those introduced by print grain artifacts. This modification has improved the algorithm’s correlation with the subjective evaluation of experts who rated the severity of printed mottle artifacts. Seeking to improve upon the mottle algorithm in ISO/IEC 13660, the ISO 24790 committee evaluated several mottle metrics. This led to the selection of the above wavelet-based approach as the top candidate algorithm for inclusion in a future ISO/IEC standard. Recent experimental results from the ISO committee showed higher correlation between the wavelet-based approach and the subjective evaluation conducted by the ISO committee members based upon 25 samples covering a variety of printed mottle artifacts. In addition, we introduce an alternative approach for measuring mottle defects based on spatial frequency analysis of wavelet- filtered images. Our goal is to establish a link between the spatial-based mottle (ISO/IEC DTS 24790) approach and its equivalent frequency-based one in light of Parseval’s theorem. Our experimental results showed a high correlation between the spatial and frequency based approaches.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ahmed H. Eid and Brian E. Cooper "On the analysis of wavelet-based approaches for print mottle artifacts", Proc. SPIE 9016, Image Quality and System Performance XI, 901609 (3 February 2014);


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