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25 February 2014 2D-fractal based algorithms for nanoparticles characterization
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Proceedings Volume 9019, Image Processing: Algorithms and Systems XII; 90190K (2014)
Event: IS&T/SPIE Electronic Imaging, 2014, San Francisco, California, United States
Fractal geometry concerns the study of non-Euclidean geometrical figures generated by a recursive sequence of mathematical operations. The proposed 2D-fractal approach was applied to characterise the image structure and texture generated by fine and ultra-fine particles when impacting on a flat surface. The work was developed with reference to particles usually produced by ultra-fine milling addressed to generate nano-particles population. In order to generate different particle populations to utilize in the study, specific milling actions have been thus performed adopting different milling actions and utilising different materials, both in terms of original size class distribution and chemical-physical attributes. The aim of the work was to develop a simple, reliable and low cost analytical set of procedures with the ability to establish correlations between particles detected by fractal characteristics and their milled-induced-properties (i.e. size class distribution, shape, surface properties, etc.). Such logic should constitute the core of a control engine addressed to realize a full monitoring of the milling process as well as to establish correlation between operative parameters, fed and resulting products characteristics.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Giuseppe Bonifazi and Silvia Serranti "2D-fractal based algorithms for nanoparticles characterization", Proc. SPIE 9019, Image Processing: Algorithms and Systems XII, 90190K (25 February 2014);


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