An indirect time-of-flight measurement technique for sub-mm range resolution using impulse photocurrent response

Takahiro Usui; Keita Yasutomi; Han San Man; Taishi Takasawa; Keiichiro Kagawa; Shoji Kawahito

doi:10.1117/12.2041160

4 March 2014 An indirect time-of-flight measurement technique for sub-mm range resolution using impulse photocurrent response

Takahiro Usui, Keita Yasutomi, Han San Man, Taishi Takasawa, Keiichiro Kagawa, Shoji Kawahito

Author Affiliations +

Proceedings Volume 9022, Image Sensors and Imaging Systems 2014; 90220W (2014) https://doi.org/10.1117/12.2041160
Event: IS&T/SPIE Electronic Imaging, 2014, San Francisco, California, United States

Abstract

This paper presents a new ToF measurement technique using an impulse photocurrent response. In the proposed technique, a laser with a short pulse width for light source, which can be regarded as an impulse input for a detector. As a result, the range calculation is determined only by photocurrent response of the detector. A test chip fabricated in a 0.11um CIS technology employs a draining-only modulation pixel, which enables a high speed charge modulation. The measurable range measured to be 50 mm within nonlinear error of 5% and the average range resolution of 0.21 mm is achieved.

Citation Download Citation

Takahiro Usui, Keita Yasutomi, Han San Man, Taishi Takasawa, Keiichiro Kagawa, and Shoji Kawahito "An indirect time-of-flight measurement technique for sub-mm range resolution using impulse photocurrent response", Proc. SPIE 9022, Image Sensors and Imaging Systems 2014, 90220W (4 March 2014); https://doi.org/10.1117/12.2041160

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