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7 March 2014 Analysis of a 64×64 matrix of direct color sensors based on spectrally tunable pixels
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Proceedings Volume 9023, Digital Photography X; 90230O (2014)
Event: IS&T/SPIE Electronic Imaging, 2014, San Francisco, California, United States
In the past years we conceived and developed the concept of spectrally tunable direct color sensors, based on the principle of the Transverse Field Detector. In this work we analyze the performance of a 64x64 (x3 colors) matrix of such a sensor built in a 150-nm CMOS standard technology for demonstrative purposes. The matrix is mounted on an electronic board that provides the biasing; the board is inserted into a suitably arranged film back slot (magazine) of a Hasselblad 500C camera. The camera is aligned in front of a transparency Macbeth Color Checker uniformly illuminated by an integrating sphere. Electrical, noise and colorimetric performance are the object of the ongoing analysis. In particular, the color reconstruction results will be compared to those obtainable through large-area devices based on the same concept.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. Caspani, G. Langfelder, A. Longoni, E. Linari, and V. Tommolini "Analysis of a 64×64 matrix of direct color sensors based on spectrally tunable pixels", Proc. SPIE 9023, Digital Photography X, 90230O (7 March 2014);

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