19 March 2014 Optimization using detective quantum efficiency (DQE) of the high-resolution parallel-hole collimators with CdTe pixelated semiconductor SPECT system
Author Affiliations +
Abstract
In previous study, to improve both sensitivity and spatial resolution, we recommended to use a pixelated parallel-hole collimator with equal hole and pixel sizes based on CdTe pixelated semiconductor SPECT system. However, the tradeoff between sensitivity and spatial resolution is needed before determination of pixelated parallel-hole collimator geometric designs. The detective quantum efficiency (DQE) is a concept which takes both the sensitivity and spatial resolution into account to provide an overall measure and may be better suited for optimization. The purpose of this study was to optimize and evaluate the above-mentioned collimators using DQE to determine the best image performance of CdTe pixelated semiconductor SPECT system. We conducted a simulation study using a Geant4 Application for Tomographic Emission (GATE) simulation. To evaluate the DQE from modulation transfer function (MTF) and sensitivity, the collimator septal heights were varied from 15 to 30 mm in 5 mm increments at step and source-to-collimator distances were 4, 5, 6, and 7 cm. According to the results, the DQE decreased with increasing source-to-collimator distance and septal height. We have presented the evaluation results of pixelated parallel-hole collimators with various geometric designs. In conclusion, we successfully optimized the pixelated parallel-hole collimator, and based on our results, we recommended using lower septal height with smaller source-to-collimator distance with CdTe pixelated semiconductor SPECT system.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Young-Jin Lee, Dae-Hong Kim, Ye-seul Kim, Hee-Joung Kim, "Optimization using detective quantum efficiency (DQE) of the high-resolution parallel-hole collimators with CdTe pixelated semiconductor SPECT system", Proc. SPIE 9033, Medical Imaging 2014: Physics of Medical Imaging, 90334J (19 March 2014); doi: 10.1117/12.2043006; https://doi.org/10.1117/12.2043006
PROCEEDINGS
9 PAGES


SHARE
Back to Top