Error analysis of a 3D imaging system based on fringe projection technique

Zonghua Zhang; Jie Dai

doi:10.1117/12.2034337

31 December 2013 Error analysis of a 3D imaging system based on fringe projection technique

Zonghua Zhang, Jie Dai

Proceedings Volume 9042, 2013 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments; 90420M (2013) https://doi.org/10.1117/12.2034337
Event: International Conference on Optical Instruments and Technology (OIT2013), 2013, Beijing, China

Abstract

In the past few years, optical metrology has found numerous applications in scientific and commercial fields owing to its non-contact nature. One of the most popular methods is the measurement of 3D surface based on fringe projection techniques because of the advantages of non-contact operation, full-field and fast acquisition and automatic data processing. In surface profilometry by using digital light processing (DLP) projector, many factors affect the accuracy of 3D measurement. However, there is no research to give the complete error analysis of a 3D imaging system. This paper will analyze some possible error sources of a 3D imaging system, for example, nonlinear response of CCD camera and DLP projector, sampling error of sinusoidal fringe pattern, variation of ambient light and marker extraction during calibration. These error sources are simulated in a software environment to demonstrate their effects on measurement. The possible compensation methods are proposed to give high accurate shape data. Some experiments were conducted to evaluate the effects of these error sources on 3D shape measurement. Experimental results and performance evaluation show that these errors have great effect on measuring 3D shape and it is necessary to compensate for them for accurate measurement.

Citation Download Citation

Zonghua Zhang and Jie Dai "Error analysis of a 3D imaging system based on fringe projection technique", Proc. SPIE 9042, 2013 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 90420M (31 December 2013); https://doi.org/10.1117/12.2034337

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