PROCEEDINGS VOLUME 9045
INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY (OIT2013) | 17-19 NOVEMBER 2013
2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology
IN THIS VOLUME

6 Sessions, 74 Papers, 0 Presentations
Imaging  (6)
INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY (OIT2013)
17-19 November 2013
Beijing, China
Front Matter: Volume 9045
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904501 (19 December 2013); doi: 10.1117/12.2052782
Imaging
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904502 (19 December 2013); doi: 10.1117/12.2032845
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904503 (19 December 2013); doi: 10.1117/12.2034082
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904504 (19 December 2013); doi: 10.1117/12.2034090
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904505 (19 December 2013); doi: 10.1117/12.2036943
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904506 (19 December 2013); doi: 10.1117/12.2035028
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904507 (19 December 2013); doi: 10.1117/12.2038144
Image Processing
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904508 (19 December 2013); doi: 10.1117/12.2035370
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904509 (19 December 2013); doi: 10.1117/12.2036679
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450A (19 December 2013); doi: 10.1117/12.2036877
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450B (19 December 2013); doi: 10.1117/12.2037173
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450C (19 December 2013); doi: 10.1117/12.2037223
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450D (19 December 2013); doi: 10.1117/12.2037345
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450E (19 December 2013); doi: 10.1117/12.2037553
Pattern Recognition
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450F (19 December 2013); doi: 10.1117/12.2034076
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450G (19 December 2013); doi: 10.1117/12.2034377
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450H (19 December 2013); doi: 10.1117/12.2036495
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450I (19 December 2013); doi: 10.1117/12.2036686
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450J (19 December 2013); doi: 10.1117/12.2037512
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450K (19 December 2013); doi: 10.1117/12.2037839
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450L (19 December 2013); doi: 10.1117/12.2038084
Measure and Calibration
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450M (19 December 2013); doi: 10.1117/12.2034253
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450N (19 December 2013); doi: 10.1117/12.2038174
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450O (19 December 2013); doi: 10.1117/12.2041743
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450P (19 December 2013); doi: 10.1117/12.2042127
Image Processing
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450Q (19 December 2013); doi: 10.1117/12.2035100
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450R (19 December 2013); doi: 10.1117/12.2037587
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450S (19 December 2013); doi: 10.1117/12.2037673
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450T (19 December 2013); doi: 10.1117/12.2038065
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450U (19 December 2013); doi: 10.1117/12.2037185
Poster Session
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450V (19 December 2013); doi: 10.1117/12.2032442
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450W (19 December 2013); doi: 10.1117/12.2032837
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450X (19 December 2013); doi: 10.1117/12.2033054
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450Y (19 December 2013); doi: 10.1117/12.2033168
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450Z (19 December 2013); doi: 10.1117/12.2033179
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904510 (19 December 2013); doi: 10.1117/12.2033411
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904511 (19 December 2013); doi: 10.1117/12.2034176
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904512 (19 December 2013); doi: 10.1117/12.2034301
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904513 (19 December 2013); doi: 10.1117/12.2034854
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904514 (19 December 2013); doi: 10.1117/12.2035110
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904515 (19 December 2013); doi: 10.1117/12.2035635
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904516 (19 December 2013); doi: 10.1117/12.2035686
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904517 (19 December 2013); doi: 10.1117/12.2035796
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904518 (19 December 2013); doi: 10.1117/12.2035938
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904519 (19 December 2013); doi: 10.1117/12.2036249
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451A (19 December 2013); doi: 10.1117/12.2036546
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451B (19 December 2013); doi: 10.1117/12.2036656
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451C (19 December 2013); doi: 10.1117/12.2036660
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451D (19 December 2013); doi: 10.1117/12.2036665
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451E (19 December 2013); doi: 10.1117/12.2036759
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451F (19 December 2013); doi: 10.1117/12.2036963
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451G (19 December 2013); doi: 10.1117/12.2036987
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451H (19 December 2013); doi: 10.1117/12.2037282
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451I (19 December 2013); doi: 10.1117/12.2037456
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451J (19 December 2013); doi: 10.1117/12.2037473
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451K (19 December 2013); doi: 10.1117/12.2037489
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451L (19 December 2013); doi: 10.1117/12.2037677
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451M (19 December 2013); doi: 10.1117/12.2038018
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451N (19 December 2013); doi: 10.1117/12.2038027
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451O (19 December 2013); doi: 10.1117/12.2038072
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451P (19 December 2013); doi: 10.1117/12.2038085
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451Q (19 December 2013); doi: 10.1117/12.2038089
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451R (19 December 2013); doi: 10.1117/12.2038090
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451S (19 December 2013); doi: 10.1117/12.2038111
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451T (19 December 2013); doi: 10.1117/12.2038139
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451U (19 December 2013); doi: 10.1117/12.2038150
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451V (19 December 2013); doi: 10.1117/12.2038158
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451W (19 December 2013); doi: 10.1117/12.2038170
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451X (19 December 2013); doi: 10.1117/12.2038287
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451Y (19 December 2013); doi: 10.1117/12.2042075
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451Z (19 December 2013); doi: 10.1117/12.2042224
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904520 (19 December 2013); doi: 10.1117/12.2042323
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904521 (19 December 2013); doi: 10.1117/12.2042371
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904522 (19 December 2013); doi: 10.1117/12.2043147
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