19 December 2013 Front Matter: Volume 9045
Proceedings Volume 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology; 904501 (2013) https://doi.org/10.1117/12.2052782
Event: International Conference on Optical Instruments and Technology (OIT2013), 2013, Beijing, China
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 9045, including the Title Page, Copyright Information, Table of Contents, and the Conference Committee listing.

The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from this book:

Author(s), “Title of Paper,” in 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, edited by Xinggang Lin,

Jesse Zheng, Proceedings of SPIE Vol. 9045 (SPIE, Bellingham, WA, 2013) Article CID Number.

ISSN: 0277-786X

ISBN: 9780819499639

Published by

SPIE

P.O. Box 10, Bellingham, Washington 98227-0010 USA

Telephone +1 360 676 3290 (Pacific Time) · Fax +1 360 647 1445

SPIE.org

Copyright © 2013, Society of Photo-Optical Instrumentation Engineers.

Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/13/$18.00.

Printed in the United States of America.

Publication of record for individual papers is online in the SPIE Digital Library.

00001_psisdg9045_904501_page_2_1.jpg

Paper Numbering: Proceedings of SPIE follow an e-First publication model, with papers published first online and then in print and on CD-ROM. Papers are published as they are submitted and meet publication criteria. A unique, consistent, permanent citation identifier (CID) number is assigned to each article at the time of the first publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online, print, and electronic versions of the publication. SPIE uses a six-digit CID article numbering system in which:

  • The first four digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc.

The CID Number appears on each page of the manuscript. The complete citation is used on the first page, and an abbreviated version on subsequent pages. Numbers in the index correspond to the last two digits of the six-digit CID Number.

Symposium Committee

General Chairs

  • Songlin Zhuang, University of Shanghai for Science and Technology (China)

  • William H. Arnold, ASML US, Inc. (United States)

Conference Cochairs

  • Yuri Chugui, New Siberia Academy of Sciences (Russian Federation)

  • Arthur Chiou, National Yang-Ming University (Taiwan, China)

  • Liwei Zhou, Beijing Institute of Technology (China)

  • Shenghua Ye, Tianjin University (China)

  • Yimo Zhang, CIS/Tianjin University (China)

Technical Program Chair

  • Guofan Jin, Tsinghua University (China)

Technical Program Cochairs

  • Jinxue Wang, Raytheon Company (United States)

  • Tiegen Liu, Tianjin University (China)

Local Organizing Committee Chair

  • Youhua Wu, China Instrument and Control Society (China)

Local Organizing Committee Cochairs

  • Guoqiang Ni, Beijing Institute of Technology (China)

  • Daoyin Yu, Tianjin University (China)

  • Yanbiao Liao, Tsinghua University (China)

  • Yulin Xi, Beijing Hamamatsu Photon Techniques Inc. (China)

General Secretary

  • Youhua Wu, China Instrument and Control Society (China)

Administrative Vice General Secretary

  • Yu-nan Sun, Beijing Institute of Technology (China)

Vice General Secretaries

  • Wei Xue, Beijing Institute of Technology (China)

  • Qun Hao, Beijing Institute of Technology (China)

  • Yuejin Zhao, Beijing Institute of Technology (China)

  • Qionghui Feng, University of Shanghai for Science and Technology (China)

  • Cunlin Zhang, Capital Normal University (China)

Local Organizing Committee

  • Changming Zhao, Beijing Institute of Technology (China)

  • Zheng You, Tsinghua University (China)

  • Yumei Wen, Chongqing University (China)

  • Hongda Chen, Institute of Semiconductors (China)

  • Shangzhong Jin, China Jiliang University (China)

  • Zhiping Zhou, Peking University (China)

  • Xuping Zhang, Nanjing University (China)

  • Libo Yuan, Harbin Engineering University (China)

  • Chunqing Gao, Beijing Institute of Technology (China)

  • Shiqiao Qin, National University of Defense Technology (China)

  • Tian Lan, Beijing Institute of Technology (China)

  • Cuiling Li, Beijing Institute of Technology (China)

  • Liquan Dong, Beijing Institute of Technology (China)

Conference Committee

Conference Chairs

  • Xinggang Lin, Tsinghua University (China)

  • Jesse Zheng, Photontech Instruments Corporation (Canada)

Program Committee

  • Weiguo Gong, Chongqing University (China)

  • Xuelong Li, Xi’an Institute of Optics and Precision Mechanics of China Academy of Sciences (China)

  • Ya Zhang, Shanghai Jiao Tong University (China)

  • Hongkai Xiong, Shanghai Jiao Tong University (China)

  • Chang Wen Chen, University at Buffalo, the State University of New York (United States)

  • C.-C. Jay Kuo, The University of Southern California (United States)

  • Dacheng Tao, University of Technology, Sydney (Australia)

  • Nong Sang, Huazhong University of Science and Technology (China)

  • Yunhong Wang, Beihang University (China)

  • Yan Yuan, Beihang University (China)

  • Xinzhu Sang, Beijing University of Posts and Telecommunications (China)

  • Sun-Chun Zhu, The University of Southern California (United States)

  • Ye Zhang, Harbin Institute of Technology (China)

  • Guijin Wang, Tsinghua University (China)

  • Bahram Javidi, University of Connecticut (United States)

  • Byoungho Lee, Seoul National University (Korea)

  • Chenbo Shi, Secretary, Tsinghua University (China)

Session Chairs

  • 1 Imaging

    Xinzhu Sang, Beijing University of Posts and Telecommunications (China)

  • 2 Image Processing

    Chenbo Shi, Tsinghua University (China)

  • 3 Pattern Recognition

    Xiaodong Chen, Tianjin University (China)

  • 4 Measure and Calibration

    Guijin Wang, Tsinghua University (China)

  • 5 Image Processing

    Xinggang Lin, Tsinghua University (China)

Introduction

With the rapid development of new materials, precision manufacturing and integration technology, opto-electronic imaging devices and image processing technology are widely applied in more and more areas from aircraft and satellite’s Earth observation, video surveillance for security, to mobile phones in daily life. Enormous new devices and methods have been developed in recent years to meet increasing needs. OIT’2013: Optoelectronic Imaging and Processing Technology conference is a well-organized platform to let researchers and practitioners from universities, institutes and industry gather together and publish their newest results.

On this conference we received more than one hundred manuscripts. Through serious peer review of every submission we accepted 73 papers, 29 for oral presentation and 44 for poster. The papers cover a wide range in this area including infrared thermal imaging, ultrasonic endoscopic imaging, laser active imaging, system calibration and measurement, new algorithms of image and video processing, image and video pattern recognition, applications of machine learning and artificial intelligence, and many industrial and consumer electronic applications. From these papers you can see increasing bands and characteristics of electromagnetic waves are being explored to construct image and video, and newly developed imaging systems bring a broad world for creating new image/video processing methods. Concerning image and video content, you can find people are working hard to make devices and systems smarter and more intelligent, so as to let the machine be available to apperceive the environment, to detect and track specific objects, to recognize and identify predefined objects like human faces or fingerprints. On all accounts I think that this conference was very fruitful and successful. I would like to take this opportunity to thank all participants of the conference for their great contributions.

Xinggang Lin

© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
} "Front Matter: Volume 9045", Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904501 (19 December 2013); doi: 10.1117/12.2052782; https://doi.org/10.1117/12.2052782
PROCEEDINGS
13 PAGES


SHARE
Back to Top