19 December 2013 A novel micro-pulse laser active imaging method based on photon counting scheme
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Proceedings Volume 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology; 904507 (2013) https://doi.org/10.1117/12.2038144
Event: International Conference on Optical Instruments and Technology (OIT2013), 2013, Beijing, China
Abstract
We present the use and characterization of a Single Photon Detector (SPD) for active micro-pulse laser imaging. Laser active imaging technology obtains the two dimensional (2D) intensity information of objects by using the active continuous or pulsed laser illumination and an image sensor array. The Maximum range of laser active imaging is limited by the performance of image sensor, whose noise can seriously lower the obtainable SNR and degrade the quality of the reconstructed image. This paper presents a photon counting scheme based micro-pulse laser active imaging method that utilizes the SPD as the receiver and the micro-pulsed laser as the source. In this case, SPD was used to detect the laser echo. By using repeated multi-cycle detection strategies, every detected photon event is treated as an independent measurement of laser echo and thus the intensity information of objects is acquired with the response possibility estimation of laser echo. We chose a Geiger-Mode Avalanche Photodiodes (GM-APD) based approach, extending the methods of micro-pulse laser active imaging. In our implement, the number of TTL pulses output from the GM-APD within the duration of the pixel dwell time was recorder by a LabView pre-programmed instrument and then the laser echo response possibility of GM-APD was established by Full Waveform Analysis algorithm. This approach combined remote imaging with single photon sensitivity and laser active imaging.
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Chenghao Liu, Wenye Yin, Zhuang Miao, Wei-ji He, Qian Chen, Guo-Hua Gu, "A novel micro-pulse laser active imaging method based on photon counting scheme", Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904507 (19 December 2013); doi: 10.1117/12.2038144; https://doi.org/10.1117/12.2038144
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